Short-circuit probe card, wafer test system, and fault detection method for the wafer test system
Kan, Chung-Hsuan, Chen, Yih-Chau, Ho, Hsuan-Min, Tsai, Yuan-Long, Lin, Shu-Chi
Year of Publication 21.11.2023
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Year of Publication 21.11.2023
Patent
SHORT-CIRCUIT PROBE CARD, WAFER TEST SYSTEM, AND FAULT DETECTION METHOD FOR THE WAFER TEST SYSTEM
CHEN, Yih-Chau, TSAI, Yuan-Long, KAN, Chung-Hsuan, LIN, Shu-Chi, HO, Hsuan-Min
Year of Publication 29.04.2021
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Year of Publication 29.04.2021
Patent