Accuracy of long-form data in the Taiwan cancer registry
Kao, Chia-Wen, Chiang, Chun-Ju, Lin, Li-Ju, Huang, Chiao-Wen, Lee, Wen-Chung, Lee, Ming-Yang, Cheng-Yi, Shiau, Lin, Hsiu-Ling, Lin, Mei-Man, Wang, Yi-Ping, Chen, Ming-Ling, Lin, Kuei-Chih, Shen, Yueh-Ying, Wu, Shu-Ching, Cheng, Shu-Chen, Chen, Pei-Lin, Lin, Yen-Chun, Wang, Su-Lan, Cheng, Chin-Ying, Chen, Chiao-Min, Chen, Shu-Chen, Cheng, Hui-Wen, Chiang, Liang-Yu, Kao, Wei-Ling, Su-Chien, Liao, Chang, Chia-Fen, Chen, Tsai-Chieh, Liau, Wei-Ling, Lin, Chia-Ling, Lee, Chia-Ling, Suen, Yueh-Yun, Wang, Chen-His, Lai, Win-Jieh, Huang, Tsai-Yun, Lin, Yu-Ru, Kao, Hui-Yu, Wei, Li-Hua, Huang, Ching-Chin, Kuo, Mei-Lin, Huang, Chiao-Pin, Chen, Shiau-Wei, Chiu, Li-Fang, Chang, Hui-Ting, Lin, Ling-Chu
Published in Journal of the Formosan Medical Association (01.11.2021)
Published in Journal of the Formosan Medical Association (01.11.2021)
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Journal Article
DR-Scan: Dual-Rail Asynchronous Scan DfT and ATPG
Hsieh, Shih-An, Wang, Ying-Hsu, Shen, Ting-Yu, Huang, Kuan-Yen, Pai, Chia-Cheng, Chen, Tsai-Chieh, Li, James Chien-Mo
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.2019)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.2019)
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Journal Article
Clock-Less DFT and BIST for Dual-Rail Asynchronous Circuits
Chen, Tsai-Chieh, Pai, Chia-Cheng, Hsieh, Yi-Zhan, Tseng, Hsiao-Yin, Chien-Mo, James, Liu, Tsung-Te, Chiu, I-Wei
Published in Journal of electronic testing (01.08.2021)
Published in Journal of electronic testing (01.08.2021)
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Journal Article
Automated Surface Defect Inspection Based on Autoencoders and Fully Convolutional Neural Networks
Lei, Cheng-Wei, Zhang, Li, Tai, Tsung-Ming, Tsai, Chen-Chieh, Hwang, Wen-Jyi, Jhang, Yun-Jie
Published in Applied sciences (01.09.2021)
Published in Applied sciences (01.09.2021)
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Journal Article
Test methodology for PCHB/PCFB Asynchronous Circuits
Shen, Ting-Yu, Pai, Chia-Cheng, Chen, Tsai-Chieh, Li, James Chien-Mo, Pan, Samuel
Published in 2018 IEEE International Test Conference (ITC) (01.10.2018)
Published in 2018 IEEE International Test Conference (ITC) (01.10.2018)
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