Dynamic (Sub)surface‐Oxygen Enables Highly Efficient Carbonyl‐Coupling for Electrochemical Carbon Dioxide Reduction
Chu, You‐Chiuan, Chen, Kuan‐Hsu, Tung, Ching‐Wei, Chen, Hsiao‐Chien, Wang, Jiali, Kuo, Tsung‐Rong, Hsu, Chia‐Shuo, Lin, Kuo‐Hsin, Tsai, Li Duan, Chen, Hao Ming
Published in Advanced materials (Weinheim) (01.06.2024)
Published in Advanced materials (Weinheim) (01.06.2024)
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The symptoms of autism including social communication deficits and repetitive and restricted behaviors are associated with different emotional and behavioral problems
Tsai, Ching-Hong, Chen, Kuan-Lin, Li, Hsing-Jung, Chen, Kuan-Hsu, Hsu, Chao-Wei, Lu, Chun-Hsiung, Hsieh, Kuan-Ying, Huang, Chien-Yu
Published in Scientific reports (25.11.2020)
Published in Scientific reports (25.11.2020)
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Polyphenol-assisted assembly of Au-deposited polylactic acid microneedles for SERS sensing and antibacterial photodynamic therapy
Chia, Zi-Chun, Chen, Yi-Lun, Chuang, Cheng-Hsun, Hsieh, Chou-Hsun, Chen, Ya-Jyun, Chen, Kuan-Hsu, Huang, Tzu-Chi, Chen, Mei-Chin, Huang, Chih-Chia
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Published in Chemical communications (Cambridge, England) (23.05.2023)
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Electrical Degradation of In Situ SiN/AlGaN/GaN MIS-HEMTs Caused by Dehydrogenation and Trap Effect Under Hot Carrier Stress
Niu, Xuerui, Ma, Xiaohua, Hou, Bin, Yang, Ling, Lin, Yu-Shan, Zhu, Qing, Ciou, Fong-Min, Chen, Kuan-Hsu, Chen, Yilin, Du, Jiale, Wu, Mei, Zhang, Meng, Wang, Chong, Chang, Ting-Chang, Hao, Yue
Published in IEEE transactions on electron devices (01.09.2021)
Published in IEEE transactions on electron devices (01.09.2021)
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Abnormal On-Current Degradation Under Non-Conductive Stress in Contact Field Plate Lateral Double-Diffused Metal-Oxide- Semiconductor Transistor With 0.13-μm Bipolar-CMOS-DMOS Technology
Hung, Wei-Chun, Tu, Yu-Fa, Chang, Ting-Chang, Tai, Mao-Chou, Tan, Yung-Fang, Chen, Kuan-Hsu, Yeh, Chien-Hung, Tu, Hong-Yi, Kuo, Hung-Ming
Published in IEEE electron device letters (01.05.2022)
Published in IEEE electron device letters (01.05.2022)
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Abnormal Two-Stage Degradation Under Hot Carrier Injection With Lateral Double-Diffused MOS With 0.13- \mu m Bipolar-CMOS-DMOS Technology
Hung, Wei-Chun, Tu, Yu-Fa, Chang, Ting-Chang, Tai, Mao-Chou, Chen, Kuan-Hsu, Jin, Fu-Yuan, Yeh, Chien-Hung, Hung, Wei-Chieh, Chang, Chin-Han, Kuo, Hung-Ming, Lien, Chen-Hsin
Published in IEEE transactions on electron devices (01.07.2023)
Published in IEEE transactions on electron devices (01.07.2023)
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Analysis of Breakdown-Voltage Increase on SiC Junction Barrier Schottky Diode Under Negative Bias Stress
Jin, Fu-Yuan, Chen, Po-Hsun, Hung, Wei-Chun, Hung, Wei-Chieh, Chang, Chin-Han, Ciou, Fong-Min, Lin, Yu-Shan, Chang, Kai-Chun, Lin, Yun-Hsuan, Kuo, Ting-Tzu, Chen, Kuan-Hsu, Yeh, Chien-Hung, Chang, Ting-Chang
Published in IEEE transactions on electron devices (01.01.2023)
Published in IEEE transactions on electron devices (01.01.2023)
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Advanced Low-Temperature-High-Pressure Hydrogen Treatment for Interface Defect Passivation in Si- and SiGe-Channel MOSCAPs
Chen, Kuan-Hsu, Lin, Chien-Yu, Chen, Min-Chen, Lin, Yu-Shan, Chang, Yen-Cheng, Lin, Yun-Hsuan, Jin, Fu-Yuan, Ciou, Fong-Min, Chang, Kai-Chun, Hung, Wei-Chun, Kuo, Ting-Tzu, Yeh, Chien-Hung, Chen, Po-Hsun, Chang, Ting-Chang
Published in IEEE transactions on electron devices (01.12.2020)
Published in IEEE transactions on electron devices (01.12.2020)
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Leakage Current in Fast Recovery Diode Suppressed by Low Temperature Supercritical Fluid Treatment Process
Hung, Wei-Chun, Jin, Fu-Yuan, Chang, Ting-Chang, Ciou, Fong-Min, Chang, Chin-Han, Lin, Chien-Yu, Lin, Yu Shan, Chang, Kai-Chun, Chang, Yen-Cheng, Lin, Yun-Hsuan, Yeh, Chien-Hung, Kuo, Ting Tzu, Chen, Kuan-Hsu
Published in IEEE electron device letters (01.10.2020)
Published in IEEE electron device letters (01.10.2020)
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Utilization and medical costs of outpatient rehabilitation among children with autism spectrum conditions in Taiwan
Li, Hsing-Jung, Chen, Chi-Yuan, Tsai, Ching-Hong, Kuo, Chao-Chan, Chen, Kung-Heng, Chen, Kuan-Hsu, Li, Ying-Chun
Published in BMC health services research (04.06.2019)
Published in BMC health services research (04.06.2019)
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Novel metal peroxide nanoboxes restrain Clostridioides difficile infection beyond the bactericidal and sporicidal activity
Yang, Li-Xing, Lai, Yi-Hsin, Cheung, Chun In, Ye, Zhi, Huang, Tzu-Chi, Wang, Yu-Chin, Chin, Yu-Cheng, Chia, Zi-Chun, Chen, Ya-Jyun, Li, Meng-Jia, Tseng, Hsiu-Ying, Tsai, Yi-Tseng, Zhang, Zhi-Bin, Chen, Kuan-Hsu, Tsai, Bo-Yang, Shieh, Dar-Bin, Lee, Nan-Yao, Tsai, Pei-Jane, Huang, Chih-Chia
Published in Bioengineering & translational medicine (01.11.2023)
Published in Bioengineering & translational medicine (01.11.2023)
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Abnormal Increment Substrate Current After Hot Carrier Stress in n-FinFET
Lin, Yu-Shan, Lin, Chien-Yu, Chang, Ting-Chang, Lin, Yun-Hsuan, Chang, Yen-Cheng, Chen, Kuan-Hsu, Liao, Jih-Chien, Jin, Fu-Yuan, Ciou, Fong-Min, Hung, Wei-Chun, Chang, Kai-Chun, Hung, Yang-Hao, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han
Published in IEEE electron device letters (01.01.2020)
Published in IEEE electron device letters (01.01.2020)
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A Study of Effects of Metal Gate Composition on Performance in Advanced n-MOSFETs
Lin, Yun-Hsuan, Lu, Ying-Hsin, Chang, Ting-Chang, Liao, Jih-Chien, Lin, Chein-Yu, Jin, Fu-Yuan, Lin, Yu-Shan, Ciou, Fong-Min, Chang, Yen-Cheng, Chang, Kai-Chun, Hung, Wei-Chun, Chen, Kuan-Hsu, Yeh, Chien-Hung, Kuo, Ting-Tzu
Published in IEEE transactions on electron devices (01.08.2019)
Published in IEEE transactions on electron devices (01.08.2019)
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Redox‐Driven Cu─Pd Bond Formation to Enhance the Efficiency for Electroreduction of CO2 to CO
Lai, Yi-An, Chu, You-Chiuan, Chang, Chia-Jui, Chen, Kuan-Hsu, Hsiao, Yu-Cheng, Chang, Chun-Chih, Liao, Mei-Yi, Chen, Hao Ming
Published in Advanced energy and sustainability research (01.10.2022)
Published in Advanced energy and sustainability research (01.10.2022)
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Malingering by Proxy Presenting with Symptoms of Posttraumatic Stress Disorder: A Case Report of Child Abuse
Li, Hsing-Jung, Chou, Frank Huang-Chih, Lin, Wen-Huei, Chen, Kuan-Hsu, Tsai, Ching-Hong
Published in Taiwan jing shen yi xue = Taiwanese journal of psychiatry (01.04.2021)
Published in Taiwan jing shen yi xue = Taiwanese journal of psychiatry (01.04.2021)
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Abnormal Threshold Voltage Degradation Under Semi-On State Stress in Si 3 N 4 /AlGaN/GaN-HEMT
Lin, Jia-Hong, Ciou, Fong-Min, Chang, Ting-Chang, Lin, Yu-Shan, Hsu, Jui-Tse, Jin, Fu-Yuan, Chang, Kai-Chun, Kuo, Ting-Tzu, Chen, Kuan-Hsu, Hung, Yang-Hao, Zheng, Yu-Zhe
Published in IEEE electron device letters (01.09.2022)
Published in IEEE electron device letters (01.09.2022)
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Journal Article
Abnormal Threshold Voltage Degradation Under Semi-On State Stress in Si3N4/AlGaN/GaN-HEMT
Lin, Jia-Hong, Ciou, Fong-Min, Chang, Ting-Chang, Lin, Yu-Shan, Hsu, Jui-Tse, Jin, Fu-Yuan, Chang, Kai-Chun, Kuo, Ting-Tzu, Chen, Kuan-Hsu, Hung, Yang-Hao, Zheng, Yu-Zhe
Published in IEEE electron device letters (01.09.2022)
Published in IEEE electron device letters (01.09.2022)
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Obtaining impact ionization-induced hole current by electrical measurements in gallium nitride metal–insulator–semiconductor high electron mobility transistors
Yeh, Yu-Hsuan, Chang, Ting-Chang, Huang, Wei-Chen, Zheng, Hao-Xuan, Tsao, Yu-Ching, Ciou, Fong-Min, Lin, Yu-Shan, Tan, Yung-Fang, Sun, Li-Chuan, Zhou, Kuan-Ju, Chen, Kuan-Hsu, Huang, Jen-Wei
Published in Journal of physics. D, Applied physics (15.07.2021)
Published in Journal of physics. D, Applied physics (15.07.2021)
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Analysis of the buffer trap-induced kink effect in AlGaN/GaN HEMT on SiC substrate
Ciou, Fong-Min, Chen, Po-Hsun, Chang, Ting-Chang, Lin, Yu-Shan, Jin, Fu-Yuan, Hsu, Jui-Tse, Lin, Jia-Hong, Chang, Kai-Chun, Kuo, Ting-Tzu, Chen, Kuan-Hsu
Published in Semiconductor science and technology (01.08.2022)
Published in Semiconductor science and technology (01.08.2022)
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Journal Article
Investigating two-stage degradation of threshold voltage induced by off-state stress in AlGaN/GaN HEMTs
Lin, Yu-Shan, Chen, Yi-Lin, Chang, Ting-Chang, Ciou, Fong-Min, Zhu, Qing, Tai, Mao‐Chou, Su, Wan-Ching, Kuo, Ting-Tzu, Chen, Kuan-Hsu, Zhu, Jie-Jie, Mi, Min-Han, Ma, Xiao-Hua, Hao, Yue
Published in Semiconductor science and technology (01.02.2022)
Published in Semiconductor science and technology (01.02.2022)
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