Room‐Temperature Ferroelectricity in Hexagonally Layered α‐In2Se3 Nanoflakes down to the Monolayer Limit
Xue, Fei, Hu, Weijin, Lee, Ko‐Chun, Lu, Li‐Syuan, Zhang, Junwei, Tang, Hao‐Ling, Han, Ali, Hsu, Wei‐Ting, Tu, Shaobo, Chang, Wen‐Hao, Lien, Chen‐Hsin, He, Jr‐Hau, Zhang, Zhidong, Li, Lain‐Jong, Zhang, Xixiang
Published in Advanced functional materials (12.12.2018)
Published in Advanced functional materials (12.12.2018)
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Journal Article
Oxidation-boosted charge trapping in ultra-sensitive van der Waals materials for artificial synaptic features
Yang, Feng-Shou, Li, Mengjiao, Lee, Mu-Pai, Ho, I-Ying, Chen, Jiann-Yeu, Ling, Haifeng, Li, Yuanzhe, Chang, Jen-Kuei, Yang, Shih-Hsien, Chang, Yuan-Ming, Lee, Ko-Chun, Chou, Yi-Chia, Ho, Ching-Hwa, Li, Wenwu, Lien, Chen-Hsin, Lin, Yen-Fu
Published in Nature communications (12.06.2020)
Published in Nature communications (12.06.2020)
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Journal Article
High Mobilities in Layered InSe Transistors with Indium‐Encapsulation‐Induced Surface Charge Doping
Li, Mengjiao, Lin, Che‐Yi, Yang, Shih‐Hsien, Chang, Yuan‐Ming, Chang, Jen‐Kuei, Yang, Feng‐Shou, Zhong, Chaorong, Jian, Wen‐Bin, Lien, Chen‐Hsin, Ho, Ching‐Hwa, Liu, Heng‐Jui, Huang, Rong, Li, Wenwu, Lin, Yen‐Fu, Chu, Junhao
Published in Advanced materials (Weinheim) (01.11.2018)
Published in Advanced materials (Weinheim) (01.11.2018)
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Journal Article
Reversible and Precisely Controllable p/n‐Type Doping of MoTe2 Transistors through Electrothermal Doping
Chang, Yuan‐Ming, Yang, Shih‐Hsien, Lin, Che‐Yi, Chen, Chang‐Hung, Lien, Chen‐Hsin, Jian, Wen‐Bin, Ueno, Keiji, Suen, Yuen‐Wuu, Tsukagoshi, Kazuhito, Lin, Yen‐Fu
Published in Advanced materials (Weinheim) (27.03.2018)
Published in Advanced materials (Weinheim) (27.03.2018)
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Journal Article
Analog Circuit Applications Based on All‐2D Ambipolar ReSe2 Field‐Effect Transistors
Lee, Ko‐Chun, Yang, Shih‐Hsien, Sung, Yung‐Shang, Chang, Yuan‐Ming, Lin, Che‐Yi, Yang, Feng‐Shou, Li, Mengjiao, Watanabe, Kenji, Taniguchi, Takashi, Ho, Ching‐Hwa, Lien, Chen‐Hsin, Lin, Yen‐Fu
Published in Advanced functional materials (31.05.2019)
Published in Advanced functional materials (31.05.2019)
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Journal Article
Low‐Voltage Operational, Low‐Power Consuming, and High Sensitive Tactile Switch Based on 2D Layered InSe Tribotronics
Li, Mengjiao, Yang, Feng‐Shou, Hsiao, Yung‐Chi, Lin, Che‐Yi, Wu, Hsing‐Mei, Yang, Shih‐Hsien, Li, Hao‐Ruei, Lien, Chen‐Hsin, Ho, Ching‐Hwa, Liu, Heng‐Jui, Li, Wenwu, Lin, Yen‐Fu, Lai, Ying‐Chih
Published in Advanced functional materials (09.05.2019)
Published in Advanced functional materials (09.05.2019)
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Journal Article
Mimic Drug Dosage Modulation for Neuroplasticity Based on Charge‐Trap Layered Electronics
Gao, Caifang, Lee, Mu‐Pai, Li, Mengjiao, Lee, Ko‐Chun, Yang, Feng‐Shou, Lin, Che‐Yi, Watanabe, Kenji, Taniguchi, Takashi, Chiu, Po‐Wen, Lien, Chen‐Hsin, Wu, Wen‐Wei, Lin, Shu‐Ping, Li, Wenwu, Lin, Yen‐Fu, Chu, Junhao
Published in Advanced functional materials (01.01.2021)
Published in Advanced functional materials (01.01.2021)
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Journal Article
Defect Engineering in Ambipolar Layered Materials for Mode‐Regulable Nociceptor
Li, Mengjiao, Yang, Feng‐Shou, Hsu, Hung‐Chang, Chen, Wan‐Hsin, Kuo, Chia Nung, Chen, Jiann‐Yeu, Yang, Shao‐Heng, Yang, Ting‐Hsun, Lin, Che‐Yi, Chou, Yi, Lee, Mu‐Pai, Chang, Yuan‐Ming, Yang, Yung‐Cheng, Lee, Ko‐Chun, Chou, Yi‐Chia, Lien, Chen‐Hsin, Lin, Chun‐Liang, Chiu, Ya‐Ping, Lue, Chin Shan, Lin, Shu‐Ping, Lin, Yen‐Fu
Published in Advanced functional materials (01.01.2021)
Published in Advanced functional materials (01.01.2021)
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Journal Article
High-Mobility InSe Transistors: The Nature of Charge Transport
Tsai, Tsung-Han, Yang, Feng-Shou, Ho, Po-Hsun, Liang, Zheng-Yong, Lien, Chen-Hsin, Ho, Ching-Hwa, Lin, Yen-Fu, Chiu, Po-Wen
Published in ACS applied materials & interfaces (02.10.2019)
Published in ACS applied materials & interfaces (02.10.2019)
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Journal Article
Atomically thin van der Waals tunnel field-effect transistors and its potential for applications
Yang, Shih-Hsien, Yao, You-Teng, Xu, Yong, Lin, Che-Yi, Chang, Yuan-Ming, Suen, Yuen-Wuu, Sun, Huabin, Lien, Chen-Hsin, Li, Wenwu, Lin, Yen-Fu
Published in Nanotechnology (08.03.2019)
Published in Nanotechnology (08.03.2019)
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Journal Article
A New Low-Voltage Triggering SCR for the Protection of a Double RESURF HV-LDMOS
Wu, Cheng-Hsu, Lee, Jian-Hsing, Lien, Chen-Hsin
Published in IEEE electron device letters (01.09.2016)
Published in IEEE electron device letters (01.09.2016)
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Journal Article
Stably Saturated Output Current Characteristics and Hot-Carrier Reliability of a-InGaZnO Thin-Film Transistors With Source-Connected Field Plate
Tu, Yu-Fa, Huang, Jen-Wei, Chang, Ting-Chang, Hung, Yang-Hao, Tai, Mao-Chou, Chen, Jian-Jie, Lin, Shih-Kai, Zhou, Kuan-Ju, Chien, Ya-Ting, Huang, Hui-Chun, Lien, Chen-Hsin
Published in IEEE transactions on electron devices (01.09.2023)
Published in IEEE transactions on electron devices (01.09.2023)
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Journal Article
Asymmetric Electrode Structure Induces Dual-Channel Phenomenon under Hot-Carrier Stress in Organic Thin-Film Transistors
Tu, Yu-Fa, Huang, Jen-Wei, Chang, Ting-Chang, Hung, Yang-Hao, Lu, I-Nien, Zhou, Kuan-Ju, Sun, Li-Chuan, Chen, Yu-An, Wu, Chia-Chuan, Hung, Wei-Chieh, Lee, Jason, Lien, Chen-Hsin
Published in IEEE electron device letters (01.09.2023)
Published in IEEE electron device letters (01.09.2023)
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Journal Article
Abnormal Two-Stage Degradation Under Hot Carrier Injection With Lateral Double-Diffused MOS With 0.13- \mu m Bipolar-CMOS-DMOS Technology
Hung, Wei-Chun, Tu, Yu-Fa, Chang, Ting-Chang, Tai, Mao-Chou, Chen, Kuan-Hsu, Jin, Fu-Yuan, Yeh, Chien-Hung, Hung, Wei-Chieh, Chang, Chin-Han, Kuo, Hung-Ming, Lien, Chen-Hsin
Published in IEEE transactions on electron devices (01.07.2023)
Published in IEEE transactions on electron devices (01.07.2023)
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Journal Article
Multifunctional full-visible-spectrum optoelectronics based on a van der Waals heterostructure
Yang, Shih-Hsien, Lee, Ko-Chun, Tsai, Meng-Yu, Chang, Yuan-Ming, Lin, Che-Yi, Yang, Feng-Shou, Watanabe, Kenji, Taniguchi, Takashi, Lien, Chen-Hsin, Ho, Ching-Hwa, Li, Mengjiao, Lin, Yen-Fu, Lai, Ying-Chih
Published in Nano energy (01.12.2019)
Published in Nano energy (01.12.2019)
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Journal Article
A High-Speed 7.2-ns Read-Write Random Access 4-Mb Embedded Resistive RAM (ReRAM) Macro Using Process-Variation-Tolerant Current-Mode Read Schemes
Meng-Fan Chang, Shyh-Shyuan Sheu, Ku-Feng Lin, Che-Wei Wu, Chia-Chen Kuo, Pi-Feng Chiu, Yih-Shan Yang, Yu-Sheng Chen, Heng-Yuan Lee, Chen-Hsin Lien, Chen, F. T., Keng-Li Su, Tzu-Kun Ku, Ming-Jer Kao, Ming-Jinn Tsai
Published in IEEE journal of solid-state circuits (01.03.2013)
Published in IEEE journal of solid-state circuits (01.03.2013)
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Journal Article
Reversible Charge‐Polarity Control for Multioperation‐Mode Transistors Based on van der Waals Heterostructures
Chen, Ciao‐Fen, Yang, Shih‐Hsien, Lin, Che‐Yi, Lee, Mu‐Pai, Tsai, Meng‐Yu, Yang, Feng‐Shou, Chang, Yuan‐Ming, Li, Mengjiao, Lee, Ko‐Chun, Ueno, Keiji, Shi, Yumeng, Lien, Chen‐Hsin, Wu, Wen‐Wei, Chiu, Po‐Wen, Li, Wenwu, Lo, Shun‐Tsung, Lin, Yen‐Fu
Published in Advanced science (01.08.2022)
Published in Advanced science (01.08.2022)
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Journal Article
Improving a-InGaZnO TFTs Reliability by Optimizing Electrode Capping Structure Under Negative Bias Illumination Stress
Tu, Yu-Fa, Lu, I-Nien, Chen, Hong-Chih, Su, Wan-Ching, Hung, Yang-Hao, Zhou, Kuan-Ju, Zheng, Yu-Zhe, Sun, Li-Chuan, Shih, Yu-Shan, Chen, Jian-Jie, Lien, Chih-Ying, Huang, Hui-Chun, Lien, Chen-Hsin, Chang, Ting-Chang
Published in IEEE electron device letters (01.08.2020)
Published in IEEE electron device letters (01.08.2020)
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Journal Article
The Effect of Humidity on Reducing Forming Voltage in Conductive-Bridge Random Access Memory With an Alloy Electrode
Lin, Shih-Kai, Chen, Min-Chen, Chang, Ting-Chang, Lien, Chen-Hsin, Chang, Jing-Shuen, Wu, Cheng-Hsien, Tseng, Yi-Ting, Xu, You-Lin, Huang, Kai-Lin, Sun, Li-Chuan, Zhang, Yong-Ci, Chiu, Yu-Ju, Sze, Simon M.
Published in IEEE electron device letters (01.10.2019)
Published in IEEE electron device letters (01.10.2019)
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Journal Article
Abnormal Relationship Between Hot Carrier Stress Degradation and Body Current in High-k Metal Gate in the 14-nm Node
Chang, Kai-Chun, Liao, Jih-Chien, Chang, Ting-Chang, Yeh, Chien-Hung, Lin, Chien-Yu, Jin, Fu-Yuan, Lin, Yu-Shan, Ciou, Fong-Min, Hung, Wei-Chun, Lin, Yun-Hsuan, Lien, Chen-Hsin, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han
Published in IEEE electron device letters (01.04.2019)
Published in IEEE electron device letters (01.04.2019)
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Journal Article