Investigation of Different Gate Bias on PMOS HCI Performance
Li, Lei, Chen, Canny, Zhao, Atman
Published in 2023 China Semiconductor Technology International Conference (CSTIC) (26.06.2023)
Published in 2023 China Semiconductor Technology International Conference (CSTIC) (26.06.2023)
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Conference Proceeding
The Verification of TDDB Acceleration Model in Ultrathin Gate Dielectric
Ying, Wen, Chen, Canny, Zhao, Atman
Published in 2023 China Semiconductor Technology International Conference (CSTIC) (26.06.2023)
Published in 2023 China Semiconductor Technology International Conference (CSTIC) (26.06.2023)
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Conference Proceeding
A Voltage Screen Model and Method for Early Failure Screening
Ying, Wen, Chen, Canny, Yang, Kelly
Published in 2022 China Semiconductor Technology International Conference (CSTIC) (20.06.2022)
Published in 2022 China Semiconductor Technology International Conference (CSTIC) (20.06.2022)
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Conference Proceeding
Study of safe operating area and improvement for power management integrated circuit
Zhou, Sarah, Yongliang Song, Chien, Kary, Chen, Canny
Published in 2017 China Semiconductor Technology International Conference (CSTIC) (01.03.2017)
Published in 2017 China Semiconductor Technology International Conference (CSTIC) (01.03.2017)
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Conference Proceeding
The electromigration failure mechanism for TSV process
Yong, L. V., Zhao, Atman, Chen, Canny
Published in 2015 China Semiconductor Technology International Conference (01.03.2015)
Published in 2015 China Semiconductor Technology International Conference (01.03.2015)
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Conference Proceeding
Journal Article