Correlation of interface structure and optical properties of Ga(N,As) and Ga(As,Bi) based type-II hetero structures
Hepp, Thilo, Firoozabadi, Saleh, Günkel, Robin, Chejarla, Varun, Maßmeyer, Oliver, Beyer, Andreas, Volz, Kerstin
Published in Journal of crystal growth (01.11.2024)
Published in Journal of crystal growth (01.11.2024)
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Journal Article
Quantification of Potential Drops Across Semiconductor Heterointerfaces Using 4D-STEM
Chejarla, Varun Shankar, Ahmed, Shamail, Beyer, Andreas, Volz, Kerstin
Published in Microscopy and microanalysis (22.07.2023)
Published in Microscopy and microanalysis (22.07.2023)
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Journal Article
Impact of Beam Size and Diffraction Effects in the Measurement of Long-Range Electric Fields in Crystalline Samples via 4DSTEM
Heimes, Damien, Chejarla, Varun Shankar, Ahmed, Shamail, Hüppe, Franziska, Beyer, Andreas, Volz, Kerstin
Published in Ultramicroscopy (01.11.2023)
Published in Ultramicroscopy (01.11.2023)
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Journal Article
Measuring Spatially‐Resolved Potential Drops at Semiconductor Hetero‐Interfaces Using 4D‐STEM
Chejarla, Varun Shankar, Ahmed, Shamail, Belz, Jürgen, Scheunert, Jonas, Beyer, Andreas, Volz, Kerstin
Published in Small methods (20.09.2023)
Published in Small methods (20.09.2023)
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Journal Article
Measuring spatially-resolved potential drops at semiconductor hetero-interfaces using 4D-STEM
Chejarla, Varun Shankar, Ahmed, Shamail, Belz, Jürgen, Scheunert, Jonas, Beyer, Andreas, Volz, Kerstin
Year of Publication 26.01.2023
Year of Publication 26.01.2023
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Journal Article