by Chef, S., Jacquir, S., Sanchez, K., Perdu, P., Binczak, S.
Published in Microelectronics and reliability (01.09.2013)

by Chef, S., Billiot, B., Jacquir, S., Sanchez, K., Perdu, P., Binczak, S.
Published in Microelectronics and reliability (01.09.2014)

by Tay, J. Y., Cheah, J., Chef, S., Zeng, X. M., Liu, Q., Gan, C. L
Published in 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (24.07.2023)

by Chua, C. T., Chef, S., Sanchez, K., Bascoul, G., Perdu, P., Tan, S. H., Gan, C. L.
Published in 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) (01.05.2018)

by Chef, S., Jacquir, S., Sanchez, K., Perdu, P., Binczak, S., Gan, C.L.
Published in Microelectronics and reliability (01.08.2015)

by Chen, S.P., Hawley, M., Van Stockum, P.B., Manoharan, H.C., Bauer, E.D.
Published in Philosophical magazine (2003. Print) (01.01.2009)

by KIM, J. H, MAEDA, M, ZHAO, Y, SHI, D. Q, DOU, S. X, CHEF, S, KIYOSHI, T
Published in Physica. C, Superconductivity (15.09.2008)

by Oh, S.J., Jung, M.N., Ha, S.Y., Choi, S.G., Kim, J.J., Kobayashi, K., Lee, S.T., Lee, H.C., Cho, Y.R., Yao, T., Chang, J.H.
Published in Physica. E, Low-dimensional systems & nanostructures (01.10.2008)

by Chef, S., Chua, C.T., Tay, J.Y., Siah, Y.W., Bhasin, S., Breier, J., Gan, C.L.
Published in 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2018)

by Perdu, P., Bascoul, G., Chef, S., Celi, G., Sanchez, K.
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)

by Chua, C.T., Liu, Q., Chef, S., Sanchez, K., Pcrdu, P., Gan, C.L.
Published in 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2018)

by Chef, S., Jacquir, S., Perdu, P., Sanchez, K., Binczak, S.
Published in Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.06.2014)

by Chef, S., Jacquir, S., Perdu, P., Sanchez, K., Binczak, S.
Published in Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.06.2014)

by Chef, S., Perdu, P., Bascoul, G., Jacquir, S., Sanchez, K., Binczak, S.
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)

by Choi, H. S., Kim, S. H., Rhee, Y., Cho, M. A., Lee, E. J., Lim, S.-K.
Published in International journal of clinical practice (Esher) (01.09.2008)

by CHEF, Y.-S, KIM, J.-G, KOO, J.-Y
Published in Corrosion (Houston, Tex.) (01.10.2007)

by Paul-Denis Brocas, François-Ambroise Didot, Chez BROCAS, Libraire, rue S. Jacques, au Chef S. Jean, De l'Imprimerie de Didot
Year of defence 1761

by Paul-Denis Brocas, Joseph Gérard Barbou, Chez Brocas, ruë S. Jacques, au Chef S. Jean, et J. Barbou, ruë S. Jacques, aux Cigognes
Year of defence 1759

by BURROS, MARIAN, CATCH AS CHEF CAN
Published in The New York times (14.06.1987)

by Nirmal Ghosh US Bureau Chef
Published in Straits times (Singapore : Daily) (02.06.2018)