Impacts of Trap-State Generation on Tunnel Thin-Film Transistor
Ma, William Cheng-Yu, Hsu, Hui-Shun, Fang, Chih-Cheng, Jao, Che-Yu, Liao, Tzu-Han
Published in IEEE transactions on electron devices (01.04.2018)
Published in IEEE transactions on electron devices (01.04.2018)
Get full text
Journal Article
Impacts of channel film thickness on poly-Si tunnel thin-film transistors
Ma, William Cheng-Yu, Hsu, Hui-Shun, Fang, Chih-Cheng, Jao, Che-Yu, Liao, Tzu-Han
Published in Thin solid films (30.08.2018)
Published in Thin solid films (30.08.2018)
Get full text
Journal Article
Positive bias temperature instability of tunnel thin-film transistor for applications of system-on-panel and three-dimension integrated circuits
Ma, William Cheng-Yu, Hui-Shun Hsu, Che-Yu Jao, Chih-Cheng Fang, Tzu-Han Liao
Published in 2017 Silicon Nanoelectronics Workshop (SNW) (01.06.2017)
Published in 2017 Silicon Nanoelectronics Workshop (SNW) (01.06.2017)
Get full text
Conference Proceeding