Electrically‐Triggered Oblique Helicoidal Cholesterics with a Single‐Layer Architecture for Next‐Generation Full‐Color Reflective Displays
Liu, Tao, Lin, Haiyi, Hou, Danxing, Wang, Jiaxing, Zeng, Shuangshuang, Che, Chuncheng, Wu, Xiaojuan, Guo, Jinbao
Published in Advanced functional materials (10.07.2024)
Published in Advanced functional materials (10.07.2024)
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Journal Article
Research on the design factors affecting the COG Mura of IPS display products
Yazhou, Bao, Gang, Yang, Xingge, Jia, Yong, Song, Hongjun, Yu, Chuncheng, Che, Hailin, Xue
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
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Conference Proceeding
Research on the Relationship between the Limit Design and Material of the LGP and the Damage of the LGP
Wang, Shixin, Yang, Gang, Song, Yong, Yu, Hongjun, Che, Chuncheng, Xue, Hailin, Wang, Kai
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
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Conference Proceeding
Modeling, simulation, and optimization of electrowetting-on-dielectric (EWOD) devices
Wei, Qiuxu, Yao, Wenliang, Gu, Le, Fan, Bolin, Gao, Yongjia, Yang, Li, Zhao, Yingying, Che, Chuncheng
Published in Biomicrofluidics (01.01.2021)
Published in Biomicrofluidics (01.01.2021)
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Journal Article
Dielectric reorientation and electrohydrodynamic instabilities in dichroic-dye-doped dual-cell liquid crystal smart window
Zhou, Bojun, Che, Chuncheng, Li, Yue, Wang, Chunlei, Wu, Yifan, Chang, Wenbo, Xiao, Yuelei, Cao, Xue, Lin, Gong, Song, Xuechao, Zhou, Yi
Published in Liquid crystals (02.01.2022)
Published in Liquid crystals (02.01.2022)
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Journal Article
Failure analysis of ESD damage on interconnects in LCD GOA
Wang, Ye, Fu, Guicui, Tian, Pengcheng, Wan, Bo, Li, Jian, Song, Yong, Yu, Hongjun, Xue, Hailin, Che, Chuncheng, Huang, Dongsheng, Rong, Keyi, Su, Yutai, Chen, Weixiong, Li, Xin
Published in Engineering failure analysis (01.01.2022)
Published in Engineering failure analysis (01.01.2022)
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Journal Article
액정 위상 시프터, 그 동작 방법, 액정 안테나, 및 통신 장치
WANG YING, JIA HAOCHENG, TING TIENLUN, WU JIE, CAO XUE, TANG CUIWEI, CAI PEIZHI, CHE CHUNCHENG, LI LIANG
Year of Publication 10.06.2020
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Year of Publication 10.06.2020
Patent
Research on the factors affecting warpage of the light guide plate in the process of reliability
Jiantong, Shang, Gang, Yang, Yong, Song, Hongjun, Yu, Chuncheng, Che
Published in 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (18.07.2022)
Published in 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (18.07.2022)
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Conference Proceeding
Study on the Factors of Start-up White Line Caused by Coupled Electric Field in TFT LCD
Li, Xin, Song, Yong, Yu, Hongjun, Che, Chuncheng, Xue, Hailin
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
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Conference Proceeding
The influence of adhesive tape on L0 light leakage of TFT-LCD products after reliability test
Xu, Tianyu, Yang, Gang, Jia, Zheng, Wang, Jingang, Song, Yong, Yu, Hongjun, Che, Chuncheng, Xue, Hailin
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
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Conference Proceeding
Research on reducing electro-static discharge of tearing film of EPD
Zou, Haowei, Li, Xin, Song, Yong, Liu, Hanqing, Ma, Junru, Yu, Hongjun, Che, Chuncheng, Xue, Hailin
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
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Conference Proceeding