Modeling Early Breakdown Failures of Gate Oxide in SiC Power MOSFETs
Chbili, Zakariae, Matsuda, Asahiko, Chbili, Jaafar, Ryan, Jason T., Campbell, Jason P., Lahbabi, Mhamed, Ioannou, Dimitris E., Cheung, Kin P.
Published in IEEE transactions on electron devices (01.09.2016)
Published in IEEE transactions on electron devices (01.09.2016)
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Journal Article
Time Dependent Dielectric Breakdown in High Quality SiC MOS Capacitors
Lahbabi, Mhamed, Chbili, Zakariae, Cheung, Kin P., Chbili, Jaafar, Ioannou, Dimitris E., Campbell, Jason P., Matocha, Kevin
Published in Materials Science Forum (24.05.2016)
Published in Materials Science Forum (24.05.2016)
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Journal Article
Cloud Security Automation Framework
Tunc, Cihan, Hariri, Salim, Merzouki, Mheni, Mahmoudi, Charif, De Vaulx, Frederic J., Chbili, Jaafar, Bohn, Robert, Battou, Abdella
Published in 2017 IEEE 2nd International Workshops on Foundations and Applications of Self Systems (FASW) (01.09.2017)
Published in 2017 IEEE 2nd International Workshops on Foundations and Applications of Self Systems (FASW) (01.09.2017)
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