RayActive: An all-in-one R2S neutron induced activation analysis tool based on new intrinsic resolution methods
Dray, N., Suraud, E., Dossat, C., Chatry, N.
Published in Nuclear engineering and design (01.01.2022)
Published in Nuclear engineering and design (01.01.2022)
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Journal Article
Multiphoton Absorption in Gallium Nitride and Silicon Carbide Photodiodes: Applications for Single Event Effects Tests
Bourgine, A., Lagarde, D., Dubos, S., Guillermin, J., Chatry, N., Chatry, C., Mauguet, M., Marie, X.
Published in IEEE transactions on nuclear science (01.07.2023)
Published in IEEE transactions on nuclear science (01.07.2023)
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Journal Article
Experimental Characterization and Simulation of Electron-Induced SEU in 45-nm CMOS Technology
Samaras, A., Pourrouquet, P., Sukhaseum, N., Gouyet, L., Vandevelde, B., Chatry, N., Ecoffet, R., Bezerra, F., Lorfevre, E.
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
Physical Mechanisms Inducing Electron Single-Event Upset
Caron, P., Inguimbert, C., Artola, L., Chatry, N., Sukhaseum, N., Ecoffet, R., Bezerra, F.
Published in IEEE transactions on nuclear science (01.08.2018)
Published in IEEE transactions on nuclear science (01.08.2018)
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Journal Article
Single-Event Latchup in a CMOS-Based ASIC Using Heavy Ions, Laser Pulses, and Coupled Simulation
Mauguet, M., Andrianjohany, N., Lagarde, D., Gouyet, L., Azema, L., Chatry, N., Marie, X., Marec, R., Calvel, P., Standarovski, D., Ecoffet, R.
Published in IEEE transactions on nuclear science (01.07.2019)
Published in IEEE transactions on nuclear science (01.07.2019)
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Journal Article
Single Events Induced By Heavy Ions and Laser Pulses in Silicon Schottky Diodes
Mauguet, M., Lagarde, D., Widmer, F., Chatry, N., Marie, X., Lorfevre, E., Bezerra, F., Marec, R., Calvel, P.
Published in IEEE transactions on nuclear science (01.08.2018)
Published in IEEE transactions on nuclear science (01.08.2018)
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Journal Article
Dose Rate Switching Technique on ELDRS-Free Bipolar Devices
Boch, J., Michez, A., Rousselet, M., Dhombres, S., Touboul, A. D., Vaille, J-R, Dusseau, L., Lorfevre, E., Chatry, N., Sukhaseum, N., Saigne, F.
Published in IEEE transactions on nuclear science (01.08.2016)
Published in IEEE transactions on nuclear science (01.08.2016)
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Journal Article
On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination
Privat, A., Touboul, A. D., Michez, A., Bourdarie, S., Vaille, J. R., Wrobel, F., Chatry, N., Chaumont, G., Lorfevre, E., Bezerra, F., Saigne, F.
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
Impact of Total Ionizing Dose on the Electromagnetic Susceptibility of a Single Bipolar Transistor
Doridant, A., Jarrix, S., Raoult, J., Blain, A., Chatry, N., Calvel, P., Hoffmann, P., Dusseau, L.
Published in IEEE transactions on nuclear science (01.08.2012)
Published in IEEE transactions on nuclear science (01.08.2012)
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Journal Article
Post-Irradiation-Gate-Stress on Power MOSFETs: Quantification of Latent Defects-Induced Reliability Degradation
Privat, A., Touboul, A. D., Michez, A., Bourdarie, S., Vaille, J. R., Wrobel, F., Arinero, R., Chatry, N., Chaumont, G., Lorfevre, E., Saigne, F.
Published in IEEE transactions on nuclear science (01.12.2013)
Published in IEEE transactions on nuclear science (01.12.2013)
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Journal Article
Combined Effects of ^Co Dose and High Frequency Interferences on a Discrete Bipolar Transistor
Doridant, A., Raoult, J., Jarrix, S., Blain, A., Hoffmann, P., Chatry, N., Calvel, P., Dusseau, L.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation
Privat, A., Touboul, A. D., Petit, M., Huselstein, J. J., Wrobel, F., Forest, F., Vaillé, J. R., Bourdarie, S., Arinero, R., Chatry, N., Chaumont, G., Lorfèvre, E., Saigné, F.
Published in IEEE transactions on nuclear science (01.08.2014)
Published in IEEE transactions on nuclear science (01.08.2014)
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Journal Article
Impact of experimental conditions for the occurrence of stuck bits in commercial SDRAM
Guillermin, J., Coic, L., Vandevelde, B., Chatry, N., Poizat, M.
Published in 2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2021)
Published in 2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2021)
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Conference Proceeding
Contribution of the Proton Direct Ionization to the SEU rate for low-scale devices
Guillermin, J., Augustin, G., Sukhaseum, N., Chatry, N., Bezerra, F., Ecoffet, R.
Published in 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2020)
Published in 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2020)
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Conference Proceeding
Electron induced SEU and MBU sensitivity of 20-nm planar and 16-nm FinFET SRAM-based FPGA
Augustin, G., Mauguet, M., Andrianjohany, N., Sukhaseum, N., Chatry, N., Bezerra, F.
Published in 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2020)
Published in 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2020)
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Conference Proceeding
High Current Events Triggered by Heavy Ion Microbeam and Pulsed Laser on a MRAM
Mauguet, M., Guillermin, J., Vandevelde, B., Chatry, N., Carron, J., Bezerra, F.
Published in 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2020)
Published in 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2020)
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Conference Proceeding
Cross-Calibration of Various SEE Test Methods Including Pulsed X-rays and Application to SEL and SEU
Augustin, G., Mauguet, M., Andrianjohany, N., Chatry, N., Bezerra, F., Capria, E., Sander, M., Voss, K-O.
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2019)
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2019)
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Conference Proceeding
High Current Event and Single Event Functional Interrupt in Non-Volatile Memories
Guillermin, J., Vandevelde, B., Chatry, N., Bezerra, F., Dangla, D., Standarovski, D., Ecoffet, R.
Published in 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2018)
Published in 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2018)
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Conference Proceeding
Single Event Effect prediction early in the design phase and latchup case study on ASIC
Andrianjohany, N., Augustin, G., Coulie, K., Gouyet, L., Rahajandraibe, W., Chatry, N., Standarovski, D., Ecoffet, R.
Published in 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2018)
Published in 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2018)
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Conference Proceeding
Risk Assessment of Electron Induced SEE during the JUICE Mission
Sukhaseum, N., Vandevelde, B., Salvy, L., Augustin, G., Varotsou, A., Chatry, N., Tali, M., Bezerra, F., Ecoffet, R., Polo, C. Boatella
Published in 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2018)
Published in 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2018)
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Conference Proceeding