by Xu, Yang, Cello, Marco, Wang, I-Chih, Walid, Anwar, Wilfong, Gordon, Wen, Charles H.-P., Marchese, Mario, Chao, H. Jonathan
Published in IEEE journal on selected areas in communications (01.03.2019)

by Wang, Michael I.-C., Wen, Charles H.-P., Chao, H. Jonathan
Published in IEEE transactions on vehicular technology (01.06.2023)

by Lin, Dave Y.-W., Wen, Charles H.-P.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.04.2020)

by Hsuan-Ming Huang, Wen, Charles H.-P
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.04.2016)

by Lin, Dave Y.-W., Wen, Charles H.-P.
Published in IEEE transactions on computers (01.05.2022)

by Liang, Aaron C.-W., Wen, Charles H.-P., Huang, Hsuan-Ming
Published in IEEE transactions on very large scale integration (VLSI) systems (01.09.2022)

by Djumanto, Setyobudi, Eko, Simanjuntak, Charles P. H., Rahardjo, M. Fadjar
Published in Scientific reports (16.11.2020)

by Chien-Hui Liao, Wen, Charles H.-P
Published in IEEE transactions on very large scale integration (VLSI) systems (01.11.2015)

by Wu, Denny C.-Y., Liang, Aaron C.-W., Wen, Charles H.-P.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.12.2020)

by Chang, Austin C-C, Huang, Ryan H-M, Wen, Charles H-P
Published in IEEE transactions on very large scale integration (VLSI) systems (01.10.2013)

by Teng, Linyih, Hung, Chi-Hsiang, Wen, Charles H.-P.
Published in NOMS 2022-2022 IEEE/IFIP Network Operations and Management Symposium (25.04.2022)

by Lin, Yu-Jie, Hung, Chi-Hsiang, Wen, Charles H.-P.
Published in IEEE access (2022)

by Yee, Ralf E.-H., Su, Nicholas Y.-J., Wang, Lowry P.-T., Wen, Charles H.-P., Chiueh, Herming
Published in 2024 IEEE 42nd VLSI Test Symposium (VTS) (22.04.2024)

by Chang, Chia-Ling (Lynn), Wen, Charles H.-P
Published in IET circuits, devices & systems (01.01.2018)

by Kang, Hsueh-Hong, Hung, Chi-Hsiang, Wen, Charles H.-P.
Published in IEEE INFOCOM 2020 - IEEE Conference on Computer Communications (01.07.2020)

by Chia-Ling Chang, Wen, Charles H.-P
Published in IEEE transactions on very large scale integration (VLSI) systems (01.06.2015)

by Lin, Louis Y.-Z, Wen, Charles H.-P
Published in IEEE access (01.01.2018)

by Hsiao, Sam M.-H., Wang, Lowry P.-T., Liang, Aaron C.-W., Wen, Charles H.-P.
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)

by Liang, Aaron C.-W., Huang, Hsuan-Ming, Wen, Charles H.-P.
Published in 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.02.2021)

by Noel, J.-P., Pezzin, M., Gauchi, R., Christmann, J.-F., Kooli, M., Charles, H.-P., Ciampolini, L., Diallo, M., Lepin, F., Blampey, B., Vivet, P., Mitra, S., Giraud, B.
Published in IEEE solid-state circuits letters (2020)