by Marshall, A. F.
Published in Characterization of High Tc Materials and Devices by Electron Microscopy (06.07.2000)

by Horiuchi, S., He, L.
Published in Characterization of High Tc Materials and Devices by Electron Microscopy (06.07.2000)

by Wen, J. G.
Published in Characterization of High Tc Materials and Devices by Electron Microscopy (06.07.2000)

by Zhu, Y.
Published in Characterization of High Tc Materials and Devices by Electron Microscopy (06.07.2000)

by Browning, N. D., Chisholm, M. F., Pennycook, S. J.
Published in Characterization of High Tc Materials and Devices by Electron Microscopy (06.07.2000)

by Van Tendeloo, G., Krekels, T.
Published in Characterization of High Tc Materials and Devices by Electron Microscopy (06.07.2000)

by Wang, Y. Y., Dravid, V. P.
Published in Characterization of High Tc Materials and Devices by Electron Microscopy (06.07.2000)

by Huebener, R. P.
Published in Characterization of High Tc Materials and Devices by Electron Microscopy (06.07.2000)

by Merkle, K. L., Gao, Y., Vuchic, B. V.
Published in Characterization of High Tc Materials and Devices by Electron Microscopy (06.07.2000)

by Tonomura, A.
Published in Characterization of High Tc Materials and Devices by Electron Microscopy (06.07.2000)

by Olsson, E.
Published in Characterization of High Tc Materials and Devices by Electron Microscopy (06.07.2000)

by Brown, L. M., Yuan, J.
Published in Characterization of High Tc Materials and Devices by Electron Microscopy (06.07.2000)

by Hawley, M. E.
Published in Characterization of High Tc Materials and Devices by Electron Microscopy (06.07.2000)

by Jia, C. L., Urban, K.
Published in Characterization of High Tc Materials and Devices by Electron Microscopy (06.07.2000)

Published in Characterization of High Tc Materials and Devices by Electron Microscopy (06.07.2000)

Published in Characterization of High Tc Materials and Devices by Electron Microscopy (06.07.2000)

Published in Characterization of High Tc Materials and Devices by Electron Microscopy (06.07.2000)

Published in Characterization of High Tc Materials and Devices by Electron Microscopy (06.07.2000)

Published in Characterization of High Tc Materials and Devices by Electron Microscopy (2000)

Published in Characterization of High Tc Materials and Devices by Electron Microscopy (2000)