by Frank, T., Moreau, S., Chappaz, C., Leduc, P., Arnaud, L., Thuaire, A., Chery, E., Lorut, F., Anghel, L., Poupon, G.
Published in Microelectronics and reliability (01.01.2013)

by Bernard, F, Casset, F, Danel, J S, Chappaz, C, Basrour, S
Published in Journal of micromechanics and microengineering (01.08.2016)

by Di Cioccio, L., Gueguen, P., Taibi, R., Landru, D., Gaudin, G., Chappaz, C., Rieutord, F., de Crecy, F., Radu, I., Chapelon, L. L., Clavelier, L.
Published in Journal of the Electrochemical Society (01.01.2011)

by Frank, T, Chappaz, C, Leduc, P, Arnaud, L, Lorut, F, Moreau, S, Thuaire, A, El Farhane, R, Anghel, L
Published in 2011 International Reliability Physics Symposium (01.04.2011)

by Chappaz, C, Nakkala, P
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)

by Giraudin, J.-G., Badets, F., Blanc, J.-P., Chataigner, E., Chappaz, C., Regolini, J.L., Delpech, P.
Published in IEEE journal of solid-state circuits (01.09.2007)

by Vianne, B., Farcy, A., Fiori, V., Chappaz, C., Chevrier, N., Lobascio, G., Chausse, P., Ponthenier, F., Ruckly, A., Escoubas, S., Thomas, O.
Published in 2015 International 3D Systems Integration Conference (3DIC) (01.08.2015)

by Casset, F., Danel, Js, Chappaz, C., Bernard, F., Basrour, S., Desloges, B., Fanget, S.
Published in 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (01.04.2015)

by Casset, F., Danel, JS, Renaux, P., Chappaz, C., Bernard, F., Sednaoui, T., Basrour, S., Desloges, B., Fanget, S.
Published in Mechatronics (Oxford) (01.12.2016)

by Bernard, F., Gorisse, M., Casset, F., Chappaz, C., Basrour, S.
Published in Procedia engineering (2014)

by Casset, F., Danel, Js, Renaux, P., Chappaz, C., Le Rhun, G., Dieppedale, C., Gorisse, M., Basrour, S., Fanget, S., Ancey, P., Devos, A., Defay, E.
Published in 2014 15th International Conference on Thermal, Mechanical and Mulit-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (01.04.2014)

by Hassine, N.B., Mercier, D., Renaux, P., Bloch, D., Parat, G., Ivira, B., Waltz, P., Chappaz, C., Fillit, R., Basrour, S.
Published in 2009 IEEE International Frequency Control Symposium Joint with the 22nd European Frequency and Time forum (01.04.2009)

by FRANK, T, MOREAU, S, CHAPPAZ, C, LEDUC, P, ARNAUD, L, THUAIRE, A, CHERY, E, LORUT, F, ANGHEL, L, POUPON, G
Published in Microelectronics and reliability (2013)

by Frank, T., Chery, E., Chappaz, C., Arnaud, L., Anghel, L.
Published in 2012 IEEE International Integrated Reliability Workshop Final Report (01.10.2012)

by Giraudin, J.-G, Badets, F, Blanc, J.-P, Chataigner, E, Chappaz, C, Regolini, J.L, Delpech, P
Published in IEEE journal of solid-state circuits (01.09.2007)

by CHAPPAZ, C drick, VEZZOLI, Eric
Year of Publication 20.07.2022

by Giraudin, J.-G., Badets, F, Blanc, J.-P., Chataigner, E, Chappaz, C, Regolini, J L, Delpech, P
Published in IEEE journal of solid-state circuits (01.09.2007)

by Frank, T., Chappaz, C., Arnaud, L., Federspiel, X., Colella, F., Petitprez, E., Anghel, L.
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)

by Giraudin, J-G, Badets, F, Blanc, J-P, Chataigner, E, Chappaz, C, Regolini, J L, Delpech, P
Published in IEEE journal of solid-state circuits (01.01.2007)

by Di Cioccio, Lea, Gueguen, P., Taibi, R., Landru, Didier, Gaudin, G., Chappaz, C., Rieutord, François, De Crecy, F., Radu, Ionut, Chapelon, L., Clavelier, Laurent
Published in ECS transactions (01.01.2010)