Light quality regulates plant biomass and fruit quality through a photoreceptor-dependent HY5-LHC/CYCB module in tomato
Yan, Jiarong, Liu, Juan, Yang, Shengdie, Jiang, Chenghao, Liu, Yanan, Zhang, Nan, Sun, Xin, Zhang, Ying, Zhu, Kangyou, Peng, Yinxia, Bu, Xin, Wang, Xiujie, Ahammed, Golam Jalal, Meng, Sida, Tan, Changhua, Liu, Yufeng, Sun, Zhouping, Qi, Mingfang, Wang, Feng, Li, Tianlai
Published in Horticulture research (01.12.2023)
Published in Horticulture research (01.12.2023)
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Journal Article
Investigation of the proportional difference characteristics of MOSFETs
Xu, Mingzhen, Tan, Changhua, Yang, Cunyu, Xie, Bing
Published in International journal of electronics (01.04.2001)
Published in International journal of electronics (01.04.2001)
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Journal Article
Dynamic oxide voltage relaxation spectroscopy
Xu, Mingzhen, Tan, Changhua, He, Yandong, Liu, Xiaowei, Wang, Yangyuan
Published in IEEE transactions on electron devices (01.04.1996)
Published in IEEE transactions on electron devices (01.04.1996)
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Journal Article
Drain Disturb Related to Negative VB in NOR flash
Shi Kai, Xu Mingzhen, Tan Changhua
Published in 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings (01.10.2006)
Published in 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings (01.10.2006)
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Conference Proceeding
Application of Proportional Difference Operator Method on Endurance Characteristics study of Flash Memory
Bing Xie, Yandong He, Mingzhen Xu, Changhua Tan
Published in 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings (01.10.2006)
Published in 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings (01.10.2006)
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Conference Proceeding
Ultrathin Oxynitride p-MOSFET Recovery Characteristics under NBTI Stress
Yandong He, Mingzhen Xu, Changhua Tan
Published in 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings (01.10.2006)
Published in 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings (01.10.2006)
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Conference Proceeding
Characteristics of as-grown hole trapping in silicon oxynitride p-MOSFETs subjected to negative bias temperature stress
Yangang Wang, Zhang, J.F., Chang, M.H., Mingzhen Xu, Changhua Tan
Published in 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (01.10.2008)
Published in 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (01.10.2008)
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Conference Proceeding