DIBL-Induced Program Disturb Characteristics in 32-nm NAND Flash Memory Array
KANG, Myounggon, HAHN, Wookghee, JANG, Seunghyun, CHO, Seongjae, PARK, Byung-Gook, SHIN, Hyungcheol, IL HAN PARK, PARK, Juyoung, SONG, Youngsun, LEE, Hocheol, EUN, Changgyu, JU, Sanghyun, CHOI, Kihwan, LIM, Youngho
Published in IEEE transactions on electron devices (01.10.2011)
Published in IEEE transactions on electron devices (01.10.2011)
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Journal Article
A Simple compact model for hot carrier injection phenomenon in 32 nm NAND flash memory device
Myounggon Kang, Wookghee Hahn, Il Han Park, Hocheol Lee, Juyoung Park, Youngsun Song, Changgyu Eun, Sanghyun Ju, Kihwan Choi, Youngho Lim, Jong-Ho Lee, Byung-Gook Park, Hyungcheol Shin
Published in 2010 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) (01.12.2010)
Published in 2010 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) (01.12.2010)
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Conference Proceeding