Practical experience of ustekinumab in patients with moderate-to-severe psoriasis who had inadequate therapeutic response to previous tumor necrosis factor blockers
Wang, Tzu-Chang, Chiu, Hsien-Yi, Wang, Ting-Shun, Tsai, Tsen-Fang
Published in Zhonghua pi fu ke yi xue za zhi (01.03.2015)
Published in Zhonghua pi fu ke yi xue za zhi (01.03.2015)
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Journal Article
Effect of mental abacus training on working memory for children
Chen, Min-Sheng, Wang, Tzu-Chang, Wang, Chih-Nan
Published in Journal of industrial and production engineering (01.09.2011)
Published in Journal of industrial and production engineering (01.09.2011)
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Journal Article
ESD protection design with adjustable snapback behavior for 5-V application in 100nm CMOS process
Chang-Tzu Wang, Yu-Chun Chen, Tien-Hao Tang, Kuan-Cheng Su
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
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Conference Proceeding
Low-leakage electrostatic discharge protection circuit in 65-nm fully-silicided CMOS technology
Chang-Tzu Wang, Ming-Dou Ker, Tien-Hao Tang, Kuan-Cheng Su
Published in 2009 IEEE International Conference on IC Design and Technology (01.05.2009)
Published in 2009 IEEE International Conference on IC Design and Technology (01.05.2009)
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Conference Proceeding
A novel method to predict fluid/structure interaction in IC packaging
Chih-Chung Hsu, Tzu-Chang Wang, Yen-Chi Chen, Yang-Kai Lin
Published in 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) (01.05.2014)
Published in 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) (01.05.2014)
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Conference Proceeding
Latch-up free ESD protection design with SCR structure in advanced CMOS technology
Chang-Tzu Wang, Tien-Hao Tang, Kuan-Cheng Su
Published in 2011 International Reliability Physics Symposium (01.04.2011)
Published in 2011 International Reliability Physics Symposium (01.04.2011)
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Conference Proceeding
Circuit solutions on ESD protection design for mixed-voltage I/O buffers in nanoscale CMOS
Ming-Dou Ker, Chang-Tzu Wang
Published in 2009 IEEE Custom Integrated Circuits Conference (01.09.2009)
Published in 2009 IEEE Custom Integrated Circuits Conference (01.09.2009)
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Conference Proceeding
The modified P+ electrode layout schemes to enhance esd robustness of SCR structure for PMIC applications
Lu-An Chen, Chang-Tzu Wang, Tai-Hsiang Lai, Tien-Hao Tang, Kuan-Cheng Su
Published in 2011 International Reliability Physics Symposium (01.04.2011)
Published in 2011 International Reliability Physics Symposium (01.04.2011)
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Conference Proceeding
Design of High-Voltage-Tolerant ESD Protection Circuit in Low-Voltage CMOS Processes
Ker, Ming-Dou, Wang, Chang-Tzu
Published in IEEE transactions on device and materials reliability (01.03.2009)
Published in IEEE transactions on device and materials reliability (01.03.2009)
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Magazine Article
ESD Protection Design by Using Only 1×VDD Low-Voltage Devices for Mixed-Voltage I/O Buffers with 3×VDD Input Tolerance
Ming-Dou Ker, Chang-Tzu Wang
Published in 2006 IEEE Asian Solid-State Circuits Conference (01.11.2006)
Published in 2006 IEEE Asian Solid-State Circuits Conference (01.11.2006)
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Conference Proceeding