Search Results - "Chang-Ta Yang" :: K.UTB vyhledávací portál

Electrical Characteristics and Thermal Stability of [Formula Omitted] Metal Gate Electrode for Advanced MOS Devices

by Chang-Ta Yang, Chang-Ta Yang, Kuei-Shu Chang-Liao, Kuei-Shu Chang-Liao, Hsin-Chun Chang, Hsin-Chun Chang, Chung-Hao Fu, Chung-Hao Fu, Tien-Ko Wang, Tien-Ko Wang, Wen-Fa Tsai, Wen-Fa Tsai, Chi-Fong Ai, Chi-Fong Ai, Wen-Fa Wu, Wen-Fa Wu
Published in IEEE transactions on electron devices (01.11.2008)

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Electrical Characteristics and Thermal Stability of hbox Hf x hbox Ta y hbox Si z hbox N Metal Gate Electrode for Advanced MOS Devices

by Yang, Chang-Ta Yang, Chang-Liao, Kuei-Shu, Chang, Hsin-Chun, Fu, Chung-Hao, Wang, Tien-Ko, Tsai, Wen-Fa, Ai, Chi-Fong, Wu, Wen-Fa
Published in IEEE transactions on electron devices (01.01.2008)

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$Electrical Characteristics and Thermal Stability of \hbox\hbox\hbox\hbox Metal Gate Electrode for Advanced MOS Devices$

Electrical Characteristics and Thermal Stability of \hbox\hbox\hbox\hbox Metal Gate Electrode for Advanced MOS Devices

by Yang, Chang-Ta, Chang-Liao, Kuei-Shu, Chang, Hsin-Chun, Fu, Chung-Hao, Wang, Tien-Ko, Tsai, Wen-Fa, Ai, Chi-Fong, Wu, Wen-Fa
Published in IEEE transactions on electron devices (01.11.2008)

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Integration of HfxTayN metal gate with SiO2 and HfOxNy gate dielectrics for MOS device applications

by Yang, Chang-Ta, Chang-Liao, Kuei-Shu, Chang, Hsin-Chun, Sahu, B.S., Wang, Tzu-Chen, Wang, Tien-Ko, Wu, Wen-Fa
Published in Microelectronic engineering (01.12.2007)

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Development of a Multiplayer Online Role-Playing Game-based Learning System for Multiple Curriculums

by Kuo-Yu Liu, Chang-Ta Yang, Kuei-Hsiang Chang
Published in 2012 IEEE Fourth International Conference On Digital Game And Intelligent Toy Enhanced Learning (01.03.2012)

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FINFET CIRCUIT DEVICES WITH WELL ISOLATION

by Yang, Chang-Ta, Yang, Chih-Chuan
Year of Publication 04.07.2024

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Patent

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FinFET circuit devices with well isolation

by Yang, Chang-Ta, Yang, Chih-Chuan
Year of Publication 02.04.2024

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Patent

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Electrical Characteristics and Thermal Stability of HfxTaySizN Metal Gate Electrode for Advanced MOS Devices

by YANG, Chang-Ta, CHANG-LIAO, Kuei-Shu, CHANG, Hsin-Chun, FU, Chung-Hao, WANG, Tien-Ko, TSAI, Wen-Fa, AI, Chi-Fong, WU, Wen-Fa
Published in IEEE transactions on electron devices (01.11.2008)

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Journal Article