Novel SONOS-Type Nonvolatile Memory Device With Optimal Al Doping in HfAlO Charge-Trapping Layer
Ping-Hung Tsai, Kuei-Shu Chang-Liao, Chu-Yung Liu, Tien-Ko Wang, Tzeng, P.J., Lin, C.H., Lee, L.S., Tsai, M.-J.
Published in IEEE electron device letters (01.03.2008)
Published in IEEE electron device letters (01.03.2008)
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Enhanced zirconia oxide dielectric quality of germanium p-channel metal oxide semiconductor field effect transistor by in-situ low temperature treatment in atomic layer deposition process
Ruan, Dun-Bao, Chang-Liao, Kuei-Shu, Li, Ji-Syuan, Yi, Shih-Han
Published in Thin solid films (01.05.2020)
Published in Thin solid films (01.05.2020)
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Advanced TiO2/Al2O3 Bilayer ALD Coatings for Improved Lithium-Rich Layered Oxide Electrodes
Chen, Wei-Ming, Hsieh, Hsin-Yu, Wu, Dong-Ze, Tang, Horng-Yi, Chang-Liao, Kuei-Shu, Chi, Po-Wei, Wu, Phillip M., Wu, Maw-Kuen
Published in ACS applied materials & interfaces (13.03.2024)
Published in ACS applied materials & interfaces (13.03.2024)
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Effects of pre- and post-microwave annealing treatments on pGe MOS device
Ruan, Dun-Bao, Chang-Liao, Kuei-Shu, Liu, Chia-Chien, Chien, Yu-Hsuan, Lee, Yao-Jen
Published in Surface & coatings technology (15.10.2021)
Published in Surface & coatings technology (15.10.2021)
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Electrical Degradation and Recovery of Low-Temperature Polycrystalline Silicon Thin-Film Transistors in Polycrystalline Silicon Plasma Process
CHANG, Jiun-Jye, CHANG-LIAO, Kuei-Shu, WANG, Tien-Ko, WU, Yung-Chun, LIN, Kao-Chao, CHEN, Chia-Yu, CHEN, Yu-Mou, TSENG, Jen-Pei, HUNG, Min-Feng
Published in IEEE transactions on electron devices (01.08.2011)
Published in IEEE transactions on electron devices (01.08.2011)
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Opto Field-Effect Transistors for Detecting Quercetin–Cu2+ Complex
Laksana, Pradhana Jati Budhi, Tsai, Li-Chu, Lin, Chang-Cheng, Chang-Liao, Kuei-Shu, Moodley, Mathew K., Chen, Chii-Dong
Published in Sensors (Basel, Switzerland) (23.09.2022)
Published in Sensors (Basel, Switzerland) (23.09.2022)
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Journal Article
Oxygen diffusion barrier on interfacial layer formed with remote NH3 plasma treatment
Ruan, Dun-Bao, Chang-Liao, Kuei-Shu, Yeh, Hsin-I, Chu, Fu-Yang, Yang, Kai-Chun, Wu, Po-Chun, Hsieh, E-Ray
Published in Surface & coatings technology (15.10.2021)
Published in Surface & coatings technology (15.10.2021)
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Journal Article
Performance Improvement for Ge FinFET CMOS Inverter With Supercritical Fluid Treatment
Ruan, Dun-Bao, Chang-Liao, Kuei-Shu, Liu, Chih-Wei, Lee, Yao-Jen, Chien, Yu-Hsuan, Kuo, Bo-Lien, Chiu, Yu-Chuan, Gan, Kai-Jhih, Hsu, Chih-Chieh, Liu, Po-Tsun
Published in IEEE electron device letters (01.06.2022)
Published in IEEE electron device letters (01.06.2022)
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Journal Article
Low EOT and oxide traps for p-substrate Ge MOS device with hafnium nitride interfacial layer
Ruan, Dun-Bao, Chang-Liao, Kuei-Shu, Hsu, Wen-Yen, Yi, Shih-Han, Lee, Yao-Jen
Published in Vacuum (01.09.2020)
Published in Vacuum (01.09.2020)
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Electrical and Reliability Characteristics of FinFETs With High-k Gate Stack and Plasma Treatments
Li, Yan-Lin, Chang-Liao, Kuei-Shu, Li, Chen-Chien, Huang, Chin-Hsiu, Tsai, Shang-Fu, Li, Cheng-Yuan, Hong, Zi-Qin, Fang, Hsin-Kai
Published in IEEE transactions on electron devices (01.01.2021)
Published in IEEE transactions on electron devices (01.01.2021)
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Journal Article
Impacts of Electrical Field in Tunneling Layer on Operation Characteristics of Poly-Ge Charge-Trapping Flash Memory Device
Fang, Hsin-Kai, Chang-Liao, Kuei-Shu, Chou, Kuan-Chi, Chao, Tzu-Cheng, Tsai, Jung-En, Li, Yan-Lin, Huang, Wen-Hsien, Shen, Chang-Hong, Shieh, Jia-Min
Published in IEEE electron device letters (01.12.2020)
Published in IEEE electron device letters (01.12.2020)
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Voltage stress induced interface states and hole trapping in germanium pMOSFETs with high-k gate dielectric and metal-gate electrode
Chiu, Fu-Chien, Chen, Wei-Chia, Wu, Jih-Huah, Chang-Liao, Kuei-Shu
Published in Materials science in semiconductor processing (15.03.2021)
Published in Materials science in semiconductor processing (15.03.2021)
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