Transcription factor HMG box‐containing protein 1 (HBP1) modulates mitotic clonal expansion (MCE) during adipocyte differentiation
Chan, Chien‐Yi, Yu, Ping, Chang, Feng‐Tzu, Chen, Zih‐Hua, Lee, Ming‐Fen, Huang, Chun‐Yin
Published in Journal of cellular physiology (01.05.2018)
Published in Journal of cellular physiology (01.05.2018)
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Journal Article
Significance of Overdrive Voltage in the Analysis of Short-Channel Behaviors of n-FinFET Devices
Eng, Yi-Chuen, Hu, Luke, Chang, Tzu-Feng, Wang, Chih-Yi, Hsu, Steven, Cheng, Osbert, Lin, Chien-Ting, Lin, Yu-Shiang, Tsai, Zen-Jay, Yang, Chih-Wei, Lu, Jim, Chen, Steve Yi-Wen
Published in IEEE journal of the Electron Devices Society (2022)
Published in IEEE journal of the Electron Devices Society (2022)
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Journal Article
Characteristics of a Smiling Polysilicon Thin-Film Transistor
LIN, Jyi-Tsong, CHANG, Tzu-Feng, ENG, Yi-Chuen, LIN, Po-Hsieh, CHEN, Cheng-Hsin
Published in IEEE electron device letters (01.06.2012)
Published in IEEE electron device letters (01.06.2012)
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Journal Article
A Three-Dimensional Simulation Study of Source/Drain-Tied Double-Gate Fin Field-Effect Transistor Design for 16-nm Half-Pitch Technology Generation and Beyond
Eng, Yi-Chuen, Lin, Jyi-Tsong, Chang, Tzu-Feng, Chen, Chun-Yu, Fan, Yi-Hsuan, Chen, Cheng-Hsin, Lin, Po-Hsieh
Published in Japanese Journal of Applied Physics (01.08.2011)
Published in Japanese Journal of Applied Physics (01.08.2011)
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Journal Article
Monitoring of FinFET Characteristics Using \Delta V}/(I}/I}) and \Delta V}/(I}/I})
Eng, Yi-Chuen, Wang, Ted, Tseng, Touber, Yang, Chih-Wei, Hsieh, Chin-Yang, Hu, Luke, Chang, Tzu-Feng, Wang, Chih-Yi, Hsu, Steven, Cheng, Osbert, Lin, Chien-Ting, Lin, Yu-Shiang, Tsai, Zen-Jay
Published in IEEE journal of the Electron Devices Society (2019)
Published in IEEE journal of the Electron Devices Society (2019)
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Journal Article
A novel poly-Si thin-film transistor with multi-trenched body by using Isotropic-etching for Suppressing Off-State Leakage
Hsien-Nan Chiu, Jyi-Tsong Lin, Yi-Chuen Eng, Po-Hiesh Lin, Tzu-Feng Chang, Chih-Hung Sun, Chih-Hao Kuo, Hsuan-Hsu Chen
Published in 2009 IEEE International Conference on IC Design and Technology (01.05.2009)
Published in 2009 IEEE International Conference on IC Design and Technology (01.05.2009)
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Conference Proceeding
Future of planar self-aligned block oxide based MOSFET technology
Jyi-Tsong Lin, Yi-Chuen Eng, Chih-Hao Kuo, Tzu-Feng Chang, Chih-Hung Sun, Po-Hsieh Lin, Hsien-Nan Chiu, Hsuan-Hsu Chen
Published in 2009 IEEE International Conference on IC Design and Technology (01.05.2009)
Published in 2009 IEEE International Conference on IC Design and Technology (01.05.2009)
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Conference Proceeding
Importance of \Delta V}}/(}} /}}) in Evaluating the Performance of n-Channel Bulk FinFET Devices
Eng, Yi-Chuen, Tseng, C. S., Huang, Ren, Lin, Po-Hsieh, Lu, Kuan-Yu, Chang, I-Fan, Lee, Chi-Ju, Wu, Yen-Liang, Chang, Mike, Hu, Luke, Chang, Tzu-Feng, Hsu, Steven, Chiou, Chun Mao, Wang, Ted, Yang, Chih-Wei, Cheng, Osbert, Wang, Chih-Yi
Published in IEEE journal of the Electron Devices Society (2018)
Published in IEEE journal of the Electron Devices Society (2018)
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Journal Article
A New Figure of Merit, } /(I,}} /I,}} )} , to Characterize Short-Channel Performance of a Bulk-Si n-Channel FinFET Device
Yi-Chuen Eng, Hu, Luke, Tzu-Feng Chang, Hsu, Steven, Chun Mao Chiou, Wang, Ted, Chih-Wei Yang, Chien-Ting Lin, I-Chang Wang, Ming-Chih Chen, Lai, Andy, Pei-Wen Wang, Chia-Jung Hsu, Wen-Yuan Pang, Chin-Hao Kuo, Cheng, Osbert, Chih-Yi Wang
Published in IEEE journal of the Electron Devices Society (01.01.2017)
Published in IEEE journal of the Electron Devices Society (01.01.2017)
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Journal Article
A Three-Dimensional Simulation Study of Source/Drain-Tied Double-Gate Fin Field-Effect Transistor Design for 16-nm Half-Pitch Technology Generation and Beyond
Eng, Yi-Chuen, Lin, Jyi-Tsong, Chang, Tzu-Feng, Chen, Chun-Yu, Fan, Yi-Hsuan, Chen, Cheng-Hsin, Lin, Po-Hsieh
Published in Japanese Journal of Applied Physics (01.08.2011)
Published in Japanese Journal of Applied Physics (01.08.2011)
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Journal Article
A Novel Vertical MOSFET with bMPI Structure for 1T-DRAM Applications: A 2-D Numerical Study
Chen, Cheng-Hsin, Lin, Jyi-Tsong, Eng, Yi-Chuen, Lin, Po-Hsieh, Chiu, Hsien-Nan, Chang, Tzu-Feng
Published in Integrated ferroelectrics (01.01.2011)
Published in Integrated ferroelectrics (01.01.2011)
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Journal Article
Design, simulation, and fabrication of a new poly-Si based capacitor-less 1T-DRAM cell
Yun-Ru Chen, Jyi-Tsong Lin, Tzu-Feng Chang, Yi-Chuen Eng, Po-Hsieh Lin, Cheng-Hsin Chen
Published in 2012 28th International Conference on Microelectronics Proceedings (01.05.2012)
Published in 2012 28th International Conference on Microelectronics Proceedings (01.05.2012)
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Conference Proceeding
Monitoring of FinFET Characteristics Using [Formula Omitted] and [Formula Omitted]
Yi-Chuen Eng, Hu, Luke, Tzu-Feng Chang, Wang, Chih-Yi, Hsu, Steven, Cheng, Osbert, Chien-Ting, Lin, Yu-Shiang, Lin, Zen-Jay Tsai, Wang, Ted, Tseng, Touber, Chih-Wei, Yang, Chin-Yang, Hsieh
Published in IEEE journal of the Electron Devices Society (01.01.2019)
Published in IEEE journal of the Electron Devices Society (01.01.2019)
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Journal Article
A simple process of thin-film transistor using the trench-oxide layer for improving 1T-DRAM performance
Hsien-Nan Chiu, Jyi-Tsong Lin, Yi-Chuen Eng, Tzu-Feng Chang, Cheng-Hsin Chen
Published in 2010 International Symposium on Next Generation Electronics (01.11.2010)
Published in 2010 International Symposium on Next Generation Electronics (01.11.2010)
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Conference Proceeding
A novel vertical MOSFET with bMPI structure for 1T-DRAM application
Cheng-Hsin Chen, Jyi-Tsong Lin, Yi-Chuen Eng, Po-Hsieh Lin, Hsien-Nan Chiu, Tzu-Feng Chang, Chih-Hsuan Tai, Kuan-Yu Lu, Yi-Hsuan Fan, Yu-Che Chang, Hsuan-Hsu Chen
Published in 2010 International Symposium on Next Generation Electronics (01.11.2010)
Published in 2010 International Symposium on Next Generation Electronics (01.11.2010)
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Conference Proceeding
Reliability analysis of a new vertical MOSFET with bMPI structure for 1T-DRAM applications
Cheng-Hsin Chen, Jyi-Tsong Lin, Po-Hsieh Lin, Yi-Chuen Eng, Hsien-Nan Chiu, Tzu-Feng Chang, Hsuan-Hsu Chen
Published in 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (01.11.2010)
Published in 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (01.11.2010)
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Conference Proceeding
Characteristics of a new trench-oxide thin-film transistor and its 1T-DRAM applications
Hsien-Nan Chiu, Jyi-Tsong Lin, Yi-Chuen Eng, Tzu-Feng Chang, Chih-Hung Sun, Po-Hiesh Lin, Chih-Hao Kuo, Hsuan-Hsu Chen, Cheng-Hsin Chen
Published in 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (01.11.2010)
Published in 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (01.11.2010)
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Conference Proceeding
Thermal characteristics of an advanced bMPI-based 1T-DRAM cell
Cheng-Hsin Chen, Jyi-Tsong Lin, Yi-Chuen Eng, Hsien-Nan Chiu, Tzu-Feng Chang, Yi-Hsuan Fan, Yu-Che Chang, Kuan-Yu Lu, Chih-Hsuan Tai
Published in 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2010)
Published in 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2010)
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Conference Proceeding
Advanced block oxide MOSFETs for 25 nm technology node
Chih-Hung Sun, Jyi-Tsong Lin, Yi-Chuen Eng, Tzu-Feng Chang, Po-Hiesh Lin, Hsuan-Hsu Chen, Chih-Hao Kuo, Hsien-Nan Chiu
Published in 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2009)
Published in 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2009)
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Conference Proceeding
A novel self-align double gate MOSFET with source/drain tie
Po-Hsieh Lin, Jyi-Tsong Lin, Yi-Chuen Eng, Hsuan-Hsu Chen, Chih-Hao Kuo, Chih-Hung Sun, Hsien-Nan Chiu, Tzu-Feng Chang, Nai-Chuan Chuang
Published in 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2009)
Published in 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2009)
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Conference Proceeding