Study of Single Silicon Quantum Dots’ Band Gap and Single-Electron Charging Energies by Room Temperature Scanning Tunneling Microscopy
Zaknoon, Bashir, Bahir, Gad, Saguy, Cecile, Edrei, Rachel, Hoffman, Alon, Rao, Rajesh A, Muralidhar, Ramachandran, Chang, Ko-Min
Published in Nano letters (01.06.2008)
Published in Nano letters (01.06.2008)
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Journal Article
A new SONOS memory using source-side injection for programming
Kuo-Tung Chang, Wei-Ming Chen, Swift, C., Higman, J.M., Paulson, W.M., Ko-Min Chang
Published in IEEE electron device letters (01.07.1998)
Published in IEEE electron device letters (01.07.1998)
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Journal Article
Flash Oxide Scalability Model and Impact of Program/Erase Method
Haggag, A., Kuhn, P., Ingersoll, P., Chi-Nan Li, Harp, T., Hoefler, A., Burnett, D., Baker, K., Ko-Min Chang
Published in 2006 IEEE International Integrated Reliability Workshop Final Report (01.10.2006)
Published in 2006 IEEE International Integrated Reliability Workshop Final Report (01.10.2006)
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Conference Proceeding
SG-TFS: A versatile embedded flash with silicon nanocrystals as the storage medium
Ko-Min Chang
Published in 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (01.10.2008)
Published in 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (01.10.2008)
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Conference Proceeding
Embedded split-gate flash memory with silicon nanocrystals for 90nm and beyond
Chindalore, G., Yater, J., Gasquet, H., Suhail, M., Sung-Taeg Kang, Cheong Min Hong, Ellis, N., Rinkenberger, G., Shen, J., Herrick, M., Malloch, W., Syzdek, R., Baker, K., Ko-Min Chang
Published in 2008 Symposium on VLSI Technology (01.06.2008)
Published in 2008 Symposium on VLSI Technology (01.06.2008)
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Conference Proceeding
An advanced embedded flash technology for broad market applications
Ko-Min Chang, Sung-Taeg Kang, Yater, J.
Published in 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (01.10.2012)
Published in 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (01.10.2012)
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Conference Proceeding
Silicon nanocrystal memory - technology and applications
Ko-Min Chang
Published in 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings (01.10.2006)
Published in 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings (01.10.2006)
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Conference Proceeding
A new scalable floating-gate EEPROM cell
Chang, Ming-Bing, Chang, Ko-Min, Kuo, Clinton, Cheng, Shih K.
Published in Solid-state electronics (1992)
Published in Solid-state electronics (1992)
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Journal Article
Designing of heavy duty handling robot (HEDURI-I robot design)
Chang-Min Ko, Gwang-Jo Chung, Doo-Hyung Kim
Published in 2009 IEEE International Conference on Mechatronics (01.04.2009)
Published in 2009 IEEE International Conference on Mechatronics (01.04.2009)
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Conference Proceeding
Comparative study of fuzzy PD control and PI control for heavy duty robot
Chang-Min Ko, Seung-Kyu Park, Tae-Sung Yoon, Doo-Hyeong Kim, Gwang-Jo Chung
Published in 2009 IEEE International Conference on Industrial Technology (01.02.2009)
Published in 2009 IEEE International Conference on Industrial Technology (01.02.2009)
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Conference Proceeding
0.5 mu m technology for advanced microcontroller applications
Sharma, Umesh, Chang, Kuo-Tung, Woo, Michael, Chang, Ko-Min, Yeargain, John R
Published in Digest of technical papers - Symposium on VLSI Technology (01.01.1994)
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Published in Digest of technical papers - Symposium on VLSI Technology (01.01.1994)
Journal Article
A 32 bit microcontroller with an embedded flash EEPROM
Kuo, C., Weidner, M., Toms, T., Choe, H., Harwood, A., Jones, R., Jelemensky, J., Ko-Min Chang
Published in 1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers (1991)
Published in 1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers (1991)
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Conference Proceeding
Low-defect-density and high-reliability FETMOS EEPROM's fabricated using furnace N2O oxynitridation
YEONG-SEUK KIM, OKADA, Y, YEARGAIN, J. R, KO-MIN CHANG, TOBIN, P. J, MORTON, B, CHOE, H, BOWERS, M, KUO, C, CHRUDIMSKY, D, AJURIA, S. A
Published in IEEE electron device letters (01.07.1993)
Published in IEEE electron device letters (01.07.1993)
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Journal Article
An embedded silicon nanocrystal nonvolatile memory for the 90nm technology node operating at 6V
Muralidhar, R., Steimle, R.F., Sadd, M., Rao, R., Swift, C.T., Prinz, E.J., Yater, J., Grieve, L., Harber, K., Hradsky, B., Straub, S., Acred, B., Paulson, W., Chen, W., Parker, L., Anderson, S.G.H., Rossow, M., Merchant, T., Paransky, M., Huynh, T., Hadad, D., Ko-Min Chang, White, B.E.
Published in 2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) (2004)
Published in 2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) (2004)
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Conference Proceeding