Novel failure mechanism of nanoscale mesa‐type avalanche photodiodes under harsh environmental stresses
Huang, Jack Jia‐Sheng, Chang, HsiangSzu, Chou, Emin, Jan, Yu‐Heng, Shi, Jin‐Wei
Published in IET Nanodielectrics (01.03.2021)
Published in IET Nanodielectrics (01.03.2021)
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