Error Resilient Hyperdimensional Computing Using Hypervector Encoding and Cross-Clustering
Mejri, Mohamed, Amarnath, Chandramouli, Chatterjee, Abhijit
Published in 2024 IEEE 42nd VLSI Test Symposium (VTS) (22.04.2024)
Published in 2024 IEEE 42nd VLSI Test Symposium (VTS) (22.04.2024)
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Conference Proceeding
OATT: Outlier Oriented Alternative Testing and Post-Manufacture Tuning of Mixed-Signal/RF Circuits and Systems
Komarraju, Suhasini, Tammana, Akhil, Amarnath, Chandramouli N, Chatterjee, Abhijit
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
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Conference Proceeding
Hierarchical Failure Modeling and Machine Learning Assisted Correction of Electro-Mechanical Subsystem Failures in Autonomous Vehicles
Amarnath, Chandramouli N, Imran Momtaz, Md, Chatterjee, Abhijit
Published in 2021 IEEE International Test Conference (ITC) (01.10.2021)
Published in 2021 IEEE International Test Conference (ITC) (01.10.2021)
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Conference Proceeding
Error Resilient Neuromorphic Systems Using Embedded Predictive Neuron Checks
Amarnath, Chandramouli, Chatterjee, Abhijit
Published in 2023 IEEE 24th Latin American Test Symposium (LATS) (21.03.2023)
Published in 2023 IEEE 24th Latin American Test Symposium (LATS) (21.03.2023)
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Conference Proceeding
Signature Driven Post-Manufacture Testing and Tuning of RRAM Spiking Neural Networks for Yield Recovery
Saha, Anurup, Amarnath, Chandramouli, Ma, Kwondo, Chatterjee, Abhijit
Published in 2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC) (22.01.2024)
Published in 2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC) (22.01.2024)
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Conference Proceeding
AMS Test Stimulus Generation and Response Analysis Using Hyperdimensional Clustering: Minimizing Misclassification Rate
Komarraju, Suhasini, Mejri, Mohamed, Tammana, Akhil, Dharmaraj, Gowsika, Amarnath, Chandramouli N, Chatterjee, Abhijit
Published in 2024 IEEE European Test Symposium (ETS) (20.05.2024)
Published in 2024 IEEE European Test Symposium (ETS) (20.05.2024)
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Conference Proceeding
Post-Manufacture Criticality-Aware Gain Tuning of Timing Encoded Spiking Neural Networks for Yield Recovery
Saha, Anurup, Ma, Kwondo, Amarnath, Chandramouli, Chatterjee, Abhijit
Published in 2024 IEEE European Test Symposium (ETS) (20.05.2024)
Published in 2024 IEEE European Test Symposium (ETS) (20.05.2024)
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Conference Proceeding
Encoded Check Driven Concurrent Error Detection in Particle Filters for Nonlinear State Estimation
Amarnath, Chandramouli N, Momtaz, Md Imran, Chatterjee, Abhijit
Published in 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) (01.07.2020)
Published in 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) (01.07.2020)
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Conference Proceeding
ADARE-HD: Adaptive-Resolution Framework for Efficient Object Detection and Tracking via HD-Computing
Mejri, Mohamed, Amarnath, Chandramouli, Chatterjee, Abhijit
Published in 2024 IEEE 67th International Midwest Symposium on Circuits and Systems (MWSCAS) (11.08.2024)
Published in 2024 IEEE 67th International Midwest Symposium on Circuits and Systems (MWSCAS) (11.08.2024)
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Conference Proceeding
Testing and Tuning of RRAM-Based DNNs: A Machine Learning-Assisted Approach
Ma, Kwondo, Saha, Anurup, Komarraju, Suhasini, Amarnath, Chandramouli, Chatterjee, Abhijit
Published in 2024 IEEE 67th International Midwest Symposium on Circuits and Systems (MWSCAS) (11.08.2024)
Published in 2024 IEEE 67th International Midwest Symposium on Circuits and Systems (MWSCAS) (11.08.2024)
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Conference Proceeding
Efficient Low Cost Alternative Testing of Analog Crossbar Arrays for Deep Neural Networks
Ma, Kwondo, Saha, Anurup, Amarnath, Chandramouli, Chatterjee, Abhijit
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
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Conference Proceeding
Low Power Neural Network Accelerators Using Collaborative Weight Tuning and Shared Shift-Add optimization
Ma, Kwondo, Mejri, Mohamed, Amarnath, Chandramouli, Chatterjee, Abhijit
Published in 2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS) (07.08.2022)
Published in 2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS) (07.08.2022)
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Conference Proceeding