Innovative methodology for failure rate estimation from quality incidents, for ISO26262 standard requirements
Berges, C., Chandon, Y., Gubian, R.
Published in 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2012)
Published in 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2012)
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