by Borrel, N., Champeix, C., Lisart, M., Sarafianos, A., Kussener, E., Rahajandraibe, W., Dutertre, J.-M
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)

by Borrel, N., Champeix, C., Kussener, E., Rahajandraibe, W., Lisart, M., Sarafianos, A., Dutertre, J.-M
Published in 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) (01.10.2015)

by Borrel, N., Champeix, C., Kussener, E., Rahajandraibe, W., Lisart, M., Sarafianos, A.
Published in 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.06.2015)

by Borrel, N., Champeix, C., Kussener, E., Rahajandraibe, W., Lisart, M., Dutertre, J.-M., Sarafianos, A.
Published in Microelectronics and reliability (01.08.2015)

by Borrel, N., Champeix, C., Kussener, E., Rahajandraibe, W., Lisart, M., Dutertre, J.-M., Sarafianos, A.
Published in Microelectronics and reliability (01.08.2015)

by Le Gall, S, Pellissier, L, Ascencio, R, Champeix, J.C, Esterni, J.P, Roblin, X
Published in La revue de medecine interne (2001)

by Le Gall, S, Pellissier, L, Ascencio, R, Champeix, J C, Esterni, J P, Roblin, X
Published in La revue de medecine interne (01.02.2001)

by Le Gall, S, Pellissier, L, Ascencio, R, Champeix, J C, Esterni, J P, Roblin, X
Published in La Revue de medecine interne (01.02.2001)