by CHAINE, M., GUBBELS, S., VOLDSTEDLUND, M., KRISTENSEN, B., NIELSEN, J., ANDERSEN, L. P., ELLERMANN-ERIKSEN, S., ENGBERG, J., HOLM, A., OLESEN, B., SCHØNHEYDER, H.C., ØSTERGAARD, C., ETHELBERG, S., MØLBAK, K.
Published in Epidemiology and infection (01.09.2017)

by Voldman, S, Anderson, W, Ashton, R, Chaine, M, Duvvury, C, Maloney, T, Worley, E
Published in Microelectronics and reliability (01.03.2001)

by Stephen, Bruce J, Allen, Craig R, Chaine, Noelle M, Fricke, Kent A, Haak, Danielle M, Hellman, Michelle L, Kill, Robert A, Nemec, Kristine T, Pope, Kevin L, Smeenk, Nicholas A, Uden, Daniel R, Unstad, Kody M, VanderHam, Ashley E, Wong, Alec
Published in Journal of freshwater ecology (01.09.2013)

by Chaine, M, Smith, S, Bui, A
Published in Microelectronics and reliability (01.11.1998)

by Unstad, Kody, Uden, Daniel, Allen, Craig, Chaine, Noelle, Haak, Danielle, Kill, Robert, Pope, Kevin, Stephen, Bruce, Wong, Alec
Published in Management of biological invasions (01.06.2013)

by Chaine, M, Verhaege, K, Avery, L, Kelly, M, Gieser, H, Bock, K, Henry, L.G, Meuse, T, Brodbeck, T, Barth, J
Published in Microelectronics and reliability (01.11.1999)

by Chaine, M, Gubbels, S, Jensen, E, Voldstedlund, M, Mølbak, K, Kristensen, B
Published in Antimicrobial resistance & infection control (20.06.2013)

by Voldman, S., Anderson, W., Ashton, R., Chaine, M., Duvvury, C., Maloney, T., Worley, E.
Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) (1999)

by Chaine, Michael, Davis, James, Kearney, Al
Published in Microelectronics and reliability (01.02.2005)

by Voldman, S., Anderson, W., Ashton, R., Chaine, M., Duvvury, C., Maloney, T., Worley, E.
Published in 1998 IEEE International Integrated Reliability Workshop Final Report (Cat. No.98TH8363) (1998)

by Kelly, M., Henry, L.G., Barth, J., Weiss, G., Chaine, M., Gieser, H., Bonfert, D., Meuse, T., Gross, V., Hatchard, C., Morgan, I.
Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) (1999)

by Chaine, M., Verhaege, K., Avery, L., Kelly, M., Gieser, H., Bock, K., Henry, L.G., Meuse, T., Brodbeck, T., Barth, J.
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)

by Xiaofeng Fan, Chaine, M.
Published in 2009 31st EOS/ESD Symposium (01.08.2009)

by Chaine, Noelle
Published in Bioinvasions records (01.11.2012)

by Jack, N., Davis, J., Chaine, M., Rosenbaum, E.
Published in 2009 31st EOS/ESD Symposium (01.08.2009)

by Haak, Danielle, Chaine, Noelle, Stephen, Bruce, Wong, Alec, Allen, Craig
Published in Bioinvasions records (2013)

by Pitak-Arnnop, Poramate, DDS, MSc, Chaine, André, MD, Oprean, Nicoleta, DDS, Dhanuthai, Kittipong, DDS, MSc, Bertrand, Jacques-Charles, MD, Bertolus, Chloé, MD, MSc
Published in Journal of cranio-maxillo-facial surgery (01.07.2010)

by Chaine, M., Davis, J., Kearney, A.
Published in 2003 Electrical Overstress/Electrostatic Discharge Symposium (01.09.2003)

by Eisinger, J., Ayavou, T., Chaine, M., Arroyo, Ph, Plantamura, A.
Published in La revue de medecine interne (1993)

by Duvvury, C., Dobson, J., Gauthier, R., Grund, E., Carn, B., Stadler, W., Miller, J., Welsher, T., Gaertner, R., Ward, S., Chaine, M., Righter, A.
Published in Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012 (01.09.2012)