Performance and Stability Characterization of Bottom Gated Amorphous Indium Gallium Zinc Oxide Thin Film Transistors Grown by RF and DC Sputtering
Park, Sung-Soo, Choi, Won-Ho, Nam, Dong-Ho, Chai, Kwang-il, Jeong, Jae-Kyeong, Lee, Hi-Deok, Lee, Ga-Won
Published in Japanese Journal of Applied Physics (01.04.2009)
Published in Japanese Journal of Applied Physics (01.04.2009)
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