A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing
Farayola, Praise O., Bruce, Isaac, Chaganti, Shravan K., Sheikh, Abalhassan, Ravi, Srivaths, Chen, Degang
Published in Journal of electronic testing (01.12.2022)
Published in Journal of electronic testing (01.12.2022)
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Journal Article
Detection of Site to Site Variations From Volume Measurement Data in Multisite Semiconductor Testing
Farayola, Praise O., Chaganti, Shravan K., Obaidi, Abdullah O., Sheikh, Abalhassan, Ravi, Srivaths, Chen, Degang
Published in IEEE transactions on instrumentation and measurement (2021)
Published in IEEE transactions on instrumentation and measurement (2021)
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Journal Article
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing
Bruce, Isaac, Farayola, Praise O., Chaganti, Shravan K., Sheikh, Abalhassan, Ravi, Srivaths, Chen, Degang
Published in Journal of electronic testing (01.02.2023)
Published in Journal of electronic testing (01.02.2023)
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Journal Article
The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing
Farayola, Praise O., Bruce, Isaac, Chaganti, Shravan K., Sheikh, Abalhassan, Ravi, Srivaths, Chen, Degang
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
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Conference Proceeding
Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing
Farayola, Praise O., Bruce, Isaac, Chaganti, Shravan K., Sheikh, Abalhassan, Ravi, Srivaths, Chen, Degang
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
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Conference Proceeding
Quantile - Quantile Fitting Approach to Detect Site to Site Variations in Massive Multi-site Testing
Farayola, Praise O., Chaganti, Shravan K., Obaidi, Abdullah O., Sheikh, Abalhassan, Ravi, Srivaths, Chen, Degang
Published in 2020 IEEE 38th VLSI Test Symposium (VTS) (01.04.2020)
Published in 2020 IEEE 38th VLSI Test Symposium (VTS) (01.04.2020)
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Conference Proceeding
Systematic Hardware Error Identification and Calibration for Massive Multisite Testing
Farayola, Praise O., Bruce, Isaac, Chaganti, Shravan K., Obaidi, Abdullah O., Sheikh, Abalhassan, Ravi, Srivaths, Chen, Degang
Published in 2021 IEEE International Test Conference (ITC) (01.10.2021)
Published in 2021 IEEE International Test Conference (ITC) (01.10.2021)
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Conference Proceeding
Low Cost High Accuracy Stimulus Generator for On-chip Spectral Testing
Bhatheja, Kushagra, Chaganti, Shravan, Chen, Degang, Jin, Xiankun Robert, Dao, Chris C, Ren, Juxiang, Kumar, Abhishek, Correa, Daniel, Lehmann, Mark, Rodriguez, Thomas, Kingham, Eric, Knight, Joel R, Dobbin, Allan, Herrin, Scott W, Garrity, Doug
Published in 2022 IEEE International Test Conference (ITC) (01.01.2022)
Published in 2022 IEEE International Test Conference (ITC) (01.01.2022)
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Conference Proceeding
Effect of flicker noise on SEIR for accurate ADC linearity testing
Yuming Zhuang, Tao Chen, Shravan Chaganti, Degang Chen
Published in 2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS) (01.08.2015)
Published in 2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS) (01.08.2015)
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Conference Proceeding
Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing
Farayola, Praise O., Bruce, Isaac, Chaganti, Shravan K., Sheikh, Abalhassan, Ravi, Srivaths, Chen, Degang
Published in 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (19.10.2022)
Published in 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (19.10.2022)
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Conference Proceeding
Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation
Farayola, Praise O., Bruce, Isaac, Chaganti, Shravan K., Sheikh, Abalhassan, Ravi, Srivaths, Chen, Degang
Published in 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) (28.06.2021)
Published in 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) (28.06.2021)
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Conference Proceeding
An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study
Bruce, Isaac, Farayola, Praise O., Chaganti, Shravan K., Obaidi, Abdullah O., Sheikh, Abalhassan, Ravi, Srivaths, Chen, Degang
Published in 2021 IEEE European Test Symposium (ETS) (24.05.2021)
Published in 2021 IEEE European Test Symposium (ETS) (24.05.2021)
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Conference Proceeding
Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME)
Chaganti, Shravan K, Chen, Tao, Zhuang, Yuming, Chen, Degang
Published in 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) (01.05.2018)
Published in 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) (01.05.2018)
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Conference Proceeding
Detection of Site to Site Variations from Volume Measurement Data in Multi-site Semiconductor Testing
Farayola, Praise O., Chaganti, Shravan K., Obaidi, Abdullah O., Sheikh, Abalhassan, Ravi, Srivaths, Chen, Degang
Published in IEEE transactions on instrumentation and measurement (2021)
Published in IEEE transactions on instrumentation and measurement (2021)
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Journal Article
Toward complete analog fault coverage with minimal observation points using a fault propagation graph
Zhiqiang Liu, Chaganti, Shravan K., Degang Chen
Published in 2016 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2016)
Published in 2016 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2016)
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Conference Proceeding
Journal Article
A low-cost method for separation and accurate estimation of ADC noise, aperture jitter, and clock jitter
Chaganti, Shravan, Li Xu, Degang Chen
Published in 2017 IEEE 35th VLSI Test Symposium (VTS) (01.04.2017)
Published in 2017 IEEE 35th VLSI Test Symposium (VTS) (01.04.2017)
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Conference Proceeding
Fast and accurate linearity test for DACs with various architectures using segmented models
Chaganti, Shravan K., Sheikh, Abalhassan, Dubey, Sumit, Ankapong, Frank, Agarwal, Nitin, Chen, Degang
Published in 2018 IEEE International Test Conference (ITC) (01.10.2018)
Published in 2018 IEEE International Test Conference (ITC) (01.10.2018)
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Conference Proceeding
Concurrent Sampling with Local Digitization - An Alternative to Analog Test Bus
Nanqi Liu, Chaganti, Shravan K., Zhiqiang Liu, Degang Chen, Majumdar, Amitava
Published in 2018 IEEE International Symposium on Circuits and Systems (ISCAS) (27.05.2018)
Published in 2018 IEEE International Symposium on Circuits and Systems (ISCAS) (27.05.2018)
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Conference Proceeding