Rapid CIS-process for high efficiency PV-modules: development towards large area processing
Probst, V, Stetter, W, Riedl, W, Vogt, H, Wendl, M, Calwer, H, Zweigart, S, Ufert, K.-D, Freienstein, B, Cerva, H, Karg, F.H
Published in Thin solid films (29.05.2001)
Published in Thin solid films (29.05.2001)
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Conference Proceeding
Morphology and optical properties of InAs(N) quantum dots
Schumann, O., Geelhaar, L., Riechert, H., Cerva, H., Abstreiter, G.
Published in Journal of applied physics (01.09.2004)
Published in Journal of applied physics (01.09.2004)
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LM-STEM Study of Dislocations in Thick Silicon
Tang, D, Rucki, A, Cerva, H, Schlossmacher, P
Published in Microscopy and microanalysis (01.07.2009)
Published in Microscopy and microanalysis (01.07.2009)
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Transmission electron microscopy of heteroepitaxial layer structures
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Conference Proceeding
Simulation of topography evolution and damage formation during TEM sample preparation using focused ion beams
Boxleitner, W., Hobler, G., Klüppel, V., Cerva, H.
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.04.2001)
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.04.2001)
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Structure and magnetoresistive properties in La–manganite thin films
Gommert, E., Cerva, H., Rucki, A., Helmolt, R. v., Wecker, J., Kuhrt, C., Samwer, K.
Published in Journal of applied physics (15.04.1997)
Published in Journal of applied physics (15.04.1997)
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High-resolution transmission electron microscopy of heterostructures
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Conference Proceeding
Misfortune, challenge, and success: defects in processed semiconductor devices
Cerva, H., Engelhardt, M., Hierlemann, M., Pölzl, M., Thenikl, T.
Published in Physica. B, Condensed matter (01.12.2001)
Published in Physica. B, Condensed matter (01.12.2001)
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The influence of oxygen on single contact resistance studied by electron energy loss spectroscopy
RUF, A, RUCKI, A, CERVA, H, GEHRING, O, PAHLITZSCH, J
Published in Journal of the Electrochemical Society (01.08.1999)
Published in Journal of the Electrochemical Society (01.08.1999)
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Defect reduction in GaAs and InP grown on planar Si(111) and on patterned Si(001) substrates
Krost, A., Schnabel, R.F., Heinrichsdorff, F., Rossow, U., Bimberg, D., Cerva, H.
Published in Journal of crystal growth (01.12.1994)
Published in Journal of crystal growth (01.12.1994)
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