Carrier Diffusion Lengths in Continuously Grown and Etched-and-Regrown GaN Pin Diodes
Celio, K. C., Armstrong, A. M., Talin, A. A., Allerman, A. A., Crawford, M. H., Pickrell, G. W., Leonard, F.
Published in IEEE electron device letters (01.07.2021)
Published in IEEE electron device letters (01.07.2021)
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Journal Article
High-Voltage Regrown Nonpolar -Plane Vertical p-n Diodes: A Step Toward Future Selective-Area-Doped Power Switches
Monavarian, M., Pickrell, G., Aragon, A. A., Stricklin, I., Crawford, M. H., Allerman, A. A., Celio, K. C., Leonard, F., Talin, A. A., Armstrong, A. M., Feezell, D.
Published in IEEE electron device letters (01.03.2019)
Published in IEEE electron device letters (01.03.2019)
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Journal Article
Laboratory X-Ray-Assisted Device Alteration for Fault Isolation and Post-Silicon Debug
Celio, K. C., Sen, S., Nisenboim, E., Pardy, P. M., Nguyen, B., Le, V., Nolting, W., Kumar, S., Peterson, C. A., Raveh, A., Johnson, K., Stripe, B., Su, F., Lun, M., Lewis, S., Spink, R. I., Yun, W.
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
High-voltage regrown nonpolar m-plane vertical p-n diodes: A step toward future selective-area-doped power switches
Monavarian, M., Pickrell, G., Aragon, A. A., Stricklin, I., Crawford, M. H., Allerman, A. A., Celio, K. C., Leonard, F., Talin, A. A., Armstrong, A. M., Feezell, D.
Published in IEEE electron device letters (01.03.2019)
Published in IEEE electron device letters (01.03.2019)
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Journal Article