The Membrane Axis of Alzheimer's Nanomedicine
Li, Yuhuan, Tang, Huayuan, Andrikopoulos, Nicholas, Javed, Ibrahim, Cecchetto, Luca, Nandakumar, Aparna, Kakinen, Aleksandr, Davis, Thomas P., Ding, Feng, Ke, Pu Chun
Published in Advanced NanoBiomed Research (Online) (01.01.2021)
Published in Advanced NanoBiomed Research (Online) (01.01.2021)
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Journal Article
Nanomaterial synthesis, an enabler of amyloidosis inhibition against human diseases
Andrikopoulos, Nicholas, Li, Yuhuan, Cecchetto, Luca, Nandakumar, Aparna, Da Ros, Tatiana, Davis, Thomas P, Velonia, Kelly, Ke, Pu Chun
Published in Nanoscale (16.07.2020)
Published in Nanoscale (16.07.2020)
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Journal Article
Identification of traction-separation parameters by means of peel testing and in situ confocal microscopy
Cattarinuzzi, Emanuele, Gastaldi, Dario, Vena, Pasquale, Pozzobon, Fiorella, Guarino, Lucrezia, Cecchetto, Luca, Andreini, Antonio
Published in Journal of micromechanics and microengineering (01.03.2019)
Published in Journal of micromechanics and microengineering (01.03.2019)
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Journal Article
Abstract A011: DPY30 regulates immunoediting by suppressing uncoordinated DNA replication in pancreatic cancer
Citron, Francesca, Perelli, Luigi, Balestrieri, Chiara, Cecchetto, Luca, Chu, Yanshuo, Ho, I-Lin, Zhang, Li, Yen, Er-Yen, Montanez, Luis Castillo, Shah, Rutvi, Attanasio, Sergio, Srinivasan, Sanjana, Dyke, Charles, Chen, Ko-Chien, Jiang, Shan, Pan, Jing, Gao, Sisi, Wang, Huamin, Yao, Wantong, Wang, Linghua, Pilato, Mauro Di, Genovese, Giannicola, Viale, Andrea, Draetta, Giulio
Published in Cancer research (Chicago, Ill.) (09.01.2024)
Published in Cancer research (Chicago, Ill.) (09.01.2024)
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Journal Article
Simulation of Moisture Ingression Ingression in Microelectronics Package to Correlate Accelerated Tests and Field Conditions Reliability
Sala, Simone Antonio, Olietti, Andrea, Morin, Sonia, Cecchetto, Luca, Zullino, Lucia, Andreini, Antonio, Rovitto, Marco, Mancaleoni, Alberto
Published in 2021 IEEE 23rd Electronics Packaging Technology Conference (EPTC) (07.12.2021)
Published in 2021 IEEE 23rd Electronics Packaging Technology Conference (EPTC) (07.12.2021)
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Conference Proceeding
Mechanical reliability of microelectronics packaging: Small scale adhesion measurements and in-situ imaging
Cattarinuzzi, Emanuele, Gastaldi, Dario, Vena, Pasquale, Pozzobon, Fiorella, Guarino, Lucrezia, Cecchetto, Luca, Andreini, Antonio
Published in 2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (01.04.2018)
Published in 2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (01.04.2018)
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Conference Proceeding
3D Power Packaged Device Thermo-Mechanical Modeling and Stress Analysis After Reliability Trials
Guarino, Lucrezia, Zullino, Lucia, Cecchetto, Luca, Pozzobon, Fiorella, Andreini, Antonio
Published in 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) (01.05.2019)
Published in 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) (01.05.2019)
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Conference Proceeding
Novel technique to reduce latch-up risk due to ESD protection devices in Smart Power technologies
Cerati, L., Cecchetto, L., Dissegna, M., Andreini, A., Ricotti, G.
Published in 2006 Electrical Overstress/Electrostatic Discharge Symposium (01.09.2006)
Published in 2006 Electrical Overstress/Electrostatic Discharge Symposium (01.09.2006)
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Conference Proceeding
CDM circuit simulation of a HV operational amplifier realized in 0.35um smart power technology
Dissegna, M., Cerati, L., Cecchetto, L., Gevinti, E., Andreini, A., Tazzoli, A., Meneghesso, G.
Published in 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2007)
Published in 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2007)
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Conference Proceeding
Novel 190V LIGBT-based ESD protection for 0.35μm Smart Power technology realized on SOI substrate
Gevinti, E., Cerati, L., Sambi, M., Dissegna, M., Cecchetto, L., Andreini, A., Tazzoli, A., Meneghesso, G.
Published in EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium (01.09.2008)
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Published in EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium (01.09.2008)
Conference Proceeding