Layout techniques to enhance the radiation tolerance of standard CMOS technologies demonstrated on a pixel detector readout chip
Snoeys, W., Faccio, F., Burns, M., Campbell, M., Cantatore, E., Carrer, N., Casagrande, L., Cavagnoli, A., Dachs, C., Di Liberto, S., Formenti, F., Giraldo, A., Heijne, E.H.M., Jarron, P., Letheren, M., Marchioro, A., Martinengo, P., Meddi, F., Mikulec, B., Morando, M., Morel, M., Noah, E., Paccagnella, A., Ropotar, I., Saladino, S., Sansen, W., Santopietro, F., Scarlassara, F., Segato, G.F., Signe, P.M., Soramel, F., Vannucci, L., Vleugels, K.
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (2000)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (2000)
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Journal Article
Total ionizing dose reliability of thin SiO2 in PowerMOSFET devices
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Conference Proceeding
Journal Article
Irradiation tests of the pixel front-end readout electronics for the ALICE experiment at LHC
Badalà, A., Barbera, R., Lo Re, G., Palmeri, A., Pappalardo, G.S., Riggi, F., Di Liberto, S., Meddi, F., Cavagnoli, A., Morando, M., Scarlassara, F., Segato, G., Soramel, F., Vannucci, L.
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (11.01.2002)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (11.01.2002)
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Journal Article
Effect of the epitaxial layer features on the reliability of medium blocking voltage power VDMOSFET during heavy ION exposure
Velardi, F., Iannuzzo, F., Busatto, G., Wyss, J., Sanseverino, A., Candelori, A., Curro, G., Cascio, A., Frisina, F., Cavagnoli, A.
Published in Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003 (2003)
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Published in Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003 (2003)
Conference Proceeding