Measurement repetitions of the Si(220) lattice spacing
Cavagnero, G, Fujimoto, H, Mana, G, Massa, E, Nakayama, K, Zosi, G
Published in Metrologia (01.02.2004)
Published in Metrologia (01.02.2004)
Get full text
Journal Article
Measurement of the silicon (220) lattice spacing
Basile, G, Bergamin, A, Cavagnero, G, Mana, G, Vittone, E, Zosi, G
Published in Physical review letters (16.05.1994)
Published in Physical review letters (16.05.1994)
Get more information
Journal Article
Measurement repetitions of the Si (220) lattice spacing
Cavagnero, G, Fujimoto, H, Mana, G, Massa, E, Nakayama, K, Zosi, G
Published in Metrologia (01.12.2004)
Published in Metrologia (01.12.2004)
Get full text
Journal Article
A two-axis tip–tilt platform for x-ray interferometry
Bergamin, A, Cavagnero, G, Durando, G, Mana, G, Massa, E
Published in Measurement science & technology (01.06.2003)
Published in Measurement science & technology (01.06.2003)
Get full text
Journal Article
A Fourier optics model of two-beam scanning laser interferometers
BERGAMIN, A, CAVAGNERO, G, CORDIALI, L, MANA, G
Published in The European physical journal. D, Atomic, molecular, and optical physics (01.03.1999)
Published in The European physical journal. D, Atomic, molecular, and optical physics (01.03.1999)
Get full text
Journal Article
Measuring small lattice distortions in Si-crystals by phase-contrast x-ray topography
Bergamin, A, Cavagnero, G, Mana, G, Massa, E, Zosi, G
Published in Journal of physics. D, Applied physics (07.11.2000)
Published in Journal of physics. D, Applied physics (07.11.2000)
Get full text
Journal Article
Optically polished surfaces parallel to the (220) lattice planes of silicon monocrystals
Bergamin, A, Cavagnero, G, Mana, G, Massa, E, Zosi, G
Published in Measurement science & technology (01.06.1999)
Published in Measurement science & technology (01.06.1999)
Get full text
Journal Article
Conference Proceeding
Beam-astigmatism in laser interferometry
Bergamin, A., Cavagnero, G., Cordiali, L., Mana, G.
Published in IEEE transactions on instrumentation and measurement (01.04.1997)
Published in IEEE transactions on instrumentation and measurement (01.04.1997)
Get full text
Journal Article
Conference Proceeding
Remeasurement of the (220) lattice spacing of silicon
Cavagnero, G., Durando, G., Mana, G., Massa, E., Zosi, G.
Published in Conference Digest Conference on Precision Electromagnetic Measurements (2002)
Published in Conference Digest Conference on Precision Electromagnetic Measurements (2002)
Get full text
Conference Proceeding
Scanning X-ray interferometry over a millimeter baseline
Bergamin, A., Cavagnero, G., Cordiali, L., Mana, G., Zosi, G.
Published in IEEE transactions on instrumentation and measurement (01.04.1997)
Published in IEEE transactions on instrumentation and measurement (01.04.1997)
Get full text
Journal Article
Conference Proceeding
The (220) lattice spacing of silicon
Basile, G., Bergamin, A., Cavagnero, G., Mana, G., Vittone, E., Zosi, G.
Published in IEEE transactions on instrumentation and measurement (01.04.1995)
Published in IEEE transactions on instrumentation and measurement (01.04.1995)
Get full text
Journal Article
Conference Proceeding
Silicon lattice constant: limits in IMGC X-ray/optical interferometry
Basile, G., Bergamin, A., Cavagnero, G., Mana, G., Vittone, E., Zosi, G.
Published in IEEE transactions on instrumentation and measurement (01.04.1991)
Published in IEEE transactions on instrumentation and measurement (01.04.1991)
Get full text
Journal Article
Conference Proceeding
Retrieval of the phase profile of digitized interferograms
Balsamo, A, Cavagnero, G, Mana, G, Massa, E
Published in Journal of optics. A, Pure and applied optics (01.07.2003)
Published in Journal of optics. A, Pure and applied optics (01.07.2003)
Get full text
Journal Article
Observation of Fresnel diffraction in a two-beam laser interferometer
Bergamin, A, Cavagnero, G, Mana, G
Published in Physical review. A, Atomic, molecular, and optical physics (01.03.1994)
Published in Physical review. A, Atomic, molecular, and optical physics (01.03.1994)
Get more information
Journal Article
Progress at IMGC in the absolute determination of the silicon d
Basile, G., Bergamin, A., Cavagnero, G., Mana, G., Zosi, G.
Published in IEEE transactions on instrumentation and measurement (01.04.1989)
Published in IEEE transactions on instrumentation and measurement (01.04.1989)
Get full text
Journal Article
Critical aspects of scanning X-ray/optical interferometry
Bergamin, A., Cavagnero, G., Mana, G., Zosi, G.
Published in 1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) (1998)
Published in 1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) (1998)
Get full text
Conference Proceeding
Imaging of Si-crystal lattice by phase-contrast X-ray microscopy [for Avogadro constant determination]
Bergamin, A., Cavagnero, G., Mana, G., Massa, E., Zosi, G.
Published in Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031) (2000)
Published in Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031) (2000)
Get full text
Conference Proceeding
A new scanning X-ray interferometer [for basic physical constants determination]
Bergamin, A., Cavagnero, G., Mana, G., Massa, E., Zosi, G., Leistner, A., Pavlovic, E.
Published in Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031) (2000)
Published in Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031) (2000)
Get full text
Conference Proceeding