Experimental assessment of electron ionization cross sections
Basaglia, T., Bonanomi, M., Cattorini, F., Han, M. C., Hoff, G., Kim, C. H., Kim, S. H., Marcoli, M., Pia, M. G., Ronchieri, E., Saracco, P.
Published in 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) (01.10.2016)
Published in 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) (01.10.2016)
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