Micron-scale experimental-numerical characterization of metal-polymer interface delamination in stretchable electronics interconnects
Kleinendorst, S.M., Fleerakkers, R., Cattarinuzzi, E., Vena, P., Gastaldi, D., van Maris, M.P.F.H.L., Hoefnagels, J.P.M.
Published in International journal of solids and structures (01.11.2020)
Published in International journal of solids and structures (01.11.2020)
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