The MEMS 5-in-1 Reference Materials (RM 8096 and 8097)
Cassard, J., Geist, J., Gaitan, M., Seiler, D. G.
Published in 2012 IEEE International Conference on Microelectronic Test Structures (01.03.2012)
Published in 2012 IEEE International Conference on Microelectronic Test Structures (01.03.2012)
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Conference Proceeding
A 256K dynamic random access memory
Benevit, C.A., Cassard, J.M., Dimmler, K.J., Dumbri, A.C., Mound, M.G., Prockyk, F.J., Rosenzweig, W., Yanof, A.W.
Published in IEEE journal of solid-state circuits (01.10.1982)
Published in IEEE journal of solid-state circuits (01.10.1982)
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Journal Article