by Kerber, A., Krishnan, S.A., Cartier, E.A.
Published in IEEE electron device letters (01.12.2009)

by Kerber, A, Krishnan, S.A, Cartier, E.A
Published in IEEE electron device letters (01.12.2009)

by Kerber, A, Maitra, K, Majumdar, A, Hargrove, M, Carter, R.J, Cartier, E.A
Published in IEEE transactions on electron devices (01.11.2008)

by Kerber, A., Cartier, E.A.
Published in IEEE transactions on device and materials reliability (01.06.2009)

by Kerber, A., Maitra, K., Majumdar, A., Hargrove, M., Carter, R.J., Cartier, E.A.
Published in IEEE transactions on electron devices (01.11.2008)

by Ren, Z., Fischetti, M.V., Gusev, E.P., Cartier, E.A., Chudzik, M.
Published in IEEE International Electron Devices Meeting 2003 (2003)

by Frank, M.M., Paruchuri, V.K., Narayanan, V., Bojarczuk, N., Linder, B., Zafar, S., Cartier, E.A., Gusev, E.P., Jamison, P.C., Lee, K.L., Steen, M.L., Copel, M., Cohen, S.A., Maitra, K., Wang, X., Kozlowski, P.M., Newbury, J.S., Medeiros, D.R., Oldiges, P., Guha, S., Jammy, R., Ieong, M., Shahidi, G.
Published in IEEE VLSI-TSA International Symposium on VLSI Technology, 2005. (VLSI-TSA-Tech) (2005)