Novel Cathode Design to Improve the ESD Capability of 600 V Fast Recovery Epitaxial Diodes
Maresca, Luca, De Caro, Giuseppe, Romano, Gianpaolo, Riccio, Michele, Breglio, Giovanni, Irace, Andrea, Bellemo, Laura, Carta, Rossano, El Baradai, Nabil
Published in Energies (Basel) (01.04.2018)
Published in Energies (Basel) (01.04.2018)
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Experimental Study on Power Consumption in Lifetime Engineered Power Diodes
Daliento, S., Mele, L., Spirito, P., Carta, R., Merlin, L.
Published in IEEE transactions on electron devices (01.11.2009)
Published in IEEE transactions on electron devices (01.11.2009)
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An Improved Methodology for the CAD Optimization of Multiple Floating Field-Limiting Ring Terminations
El Baradai, N, Sanfilippo, C, Carta, R, Cappelluti, F, Bonani, F
Published in IEEE transactions on electron devices (01.01.2011)
Published in IEEE transactions on electron devices (01.01.2011)
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Characterization of recombination centers in Si epilayers after He implantation by direct measurement of local lifetime distribution with the AC lifetime profiling technique
Spirito, P., Daliento, S., Sanseverino, A., Gialanella, L., Romano, M., Limata, B.N., Carta, R., Bellemo, L.
Published in IEEE electron device letters (01.09.2004)
Published in IEEE electron device letters (01.09.2004)
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