by Carrere, J.-P, Place, S., Oddou, J.-P, Benoit, D., Roy, F.
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)

by Carrère, J.P., Oddou, J.P., Place, S., Richard, C., Benoit, D., Jenny, C., Gatefait, M., Aumont, C., Tournier, A., Roy, F.
Published in Solid-state electronics (01.11.2011)

by Akbal, M., Ribes, G., Poiroux, T., Carrere, J.-P, Vallier, L.
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)

by Ramadout, B., Guo-Neng Lu, Carrere, J.-P., Pinzelli, L., Perrot, C., Rivoire, M., Nemouchi, F.
Published in IEEE electron device letters (01.12.2009)

by Sacchettini, Y., Carrere, J. -P., Goiffon, V., Magnan, P.
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)

by Sacchettini, Y., Carrere, J.-P., Doyen, C., Duru, R., Courouble, K., Ricq, S., Goiffon, V., Magnan, P.
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)

by Roy, Francois, Tournier, A., Wehbe-Alause, H., Blanchet, F., Boulenc, P., Leverd, F., Favennec, L., Perrot, C., Pinzelli, L., Gatefait, M., Cherault, N., Jeanjean, D., Carrere, J. P., Augier, C., Ricq, S., Herault, D., Hulot, S.
Published in Physica status solidi. C (01.01.2014)

by Carrère, J-P., Garnier, P., Desvoivres, L., Berthoud, A., Lunenborg, M.
Published in Microelectronic engineering (01.09.2007)

by Devoivre, T., Lunenborg, M., Julien, C., Carrere, J.-P., Ferreira, P., Toren, W.J., VandeGoor, A., Gayet, P., Berger, T., Hinsinger, O., Vannier, P., Trouiller, Y., Rody, Y., Goirand, P.-J., Palla, R., Thomas, I., Guyader, F., Roy, D., Borot, B., Planes, N., Naudet, S., Pico, F., Duca, D., Lalanne, F., Heslinga, D., Haond, M.
Published in Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) (2002)

by Carrere, J.-P., Larman, F., van der Vegt, E., Bocat, M., Auriac, N., Cherault, N., Charleux, M., Rochereau, K., Hopstaken, M., Pantel, R., Boter, D., Dormans, D.
Published in ESSDERC 2007 - 37th European Solid State Device Research Conference (01.09.2007)

by Ahmed, N., Roy, F., Lu, G.-N, Mamdy, B., Carrere, J.-P, Tournier, A., Virollet, N., Perrot, C., Rivoire, M., Seignard, A., Pellissier-Tanon, D., Leverd, F., Orlando, B.
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)

by Carrere, J.-P., Bidaud, M., Guyader, F., Haond, M.
Published in 30th European Solid-State Device Research Conference (2000)

by CARRERE, J-P, GROUILLET, A, GUYADER, F, BEVERINA, A, BIDAUD, M, HALIMAOUI, A
Year of Publication 2002

by Bidaud, M., Carrere, J.P., Guyader, F., Juhel, M., Pantel, R.
Published in 32nd European Solid-State Device Research Conference (2002)

by Place, S., Carrere, J.-P., Allegret, S., Magnan, P., Goiffon, V., Roy, F.
Published in IEEE transactions on nuclear science (01.08.2012)

by Place, S, Carrere, J.-P, Allegret, S, Magnan, P, Goiffon, V, Roy, F
Published in IEEE transactions on nuclear science (01.08.2012)

by Place, S, Carrere, J-P, Allegret, S, Magnan, P, Goiffon, V, Roy, F
Published in IEEE transactions on nuclear science (01.08.2012)

by Place, S., Carrere, J-P, Allegret, S., Magnan, P., Goiffon, V., Roy, F.
Published in IEEE transactions on nuclear science (01.12.2012)

by Carrere, J.-P., Bernard, H., Petitdidier, S., Beverina, A., Rosa, J., Guyader, F.
Published in ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003 (2003)

by Carrere, J.-P., Heslinga, D.R.
Published in 1999 4th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.99TH8395) (1999)