A generic "micro-Stoney" method for the measurement of internal stress and elastic modulus of ultrathin films
Favache, Audrey, Ryelandt, Sophie, Melchior, Maxime, Zeb, Gul, Carbonnelle, Pierre, Raskin, Jean-Pierre, Pardoen, Thomas
Published in Review of scientific instruments (01.01.2016)
Published in Review of scientific instruments (01.01.2016)
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Journal Article
Interactive Model Expansion in an Observable Environment
CARBONNELLE, PIERRE, VENNEKENS, JOOST, DENECKER, MARC, BOGAERTS, BART
Published in Theory and practice of logic programming (01.07.2023)
Published in Theory and practice of logic programming (01.07.2023)
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Journal Article
Quantification and Aggregation over Concepts of the Ontology
Carbonnelle, Pierre, Van der Hallen, Matthias, Denecker, Marc
Published in Electronic proceedings in theoretical computer science (12.09.2023)
Published in Electronic proceedings in theoretical computer science (12.09.2023)
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Journal Article
Using Symmetries to Lift Satisfiability Checking
Carbonnelle, Pierre, Schenner, Gottfried, Bruynooghe, Maurice, Bogaerts, Bart, Denecker, Marc
Year of Publication 06.11.2023
Year of Publication 06.11.2023
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Journal Article
Interactive Model Expansion in an Observable Environment
Carbonnelle, Pierre, Vennekens, Joost, Bogaerts, Bart, Denecker, Marc
Year of Publication 20.05.2023
Year of Publication 20.05.2023
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Journal Article
Interactive configurator with FO(.) and IDP-Z3
Carbonnelle, Pierre, Vandevelde, Simon, Vennekens, Joost, Denecker, Marc
Year of Publication 01.02.2022
Year of Publication 01.02.2022
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Journal Article
Using Symmetries to Lift Satisfiability Checking
Carbonnelle, Pierre, Schenner, Gottfried, Bruynooghe, Maurice, Bogaerts, Bart, Denecker, Marc
Published in arXiv.org (14.12.2023)
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Published in arXiv.org (14.12.2023)
Paper
Interactive Model Expansion in an Observable Environment
Carbonnelle, Pierre, Vennekens, Joost, Bogaerts, Bart, Denecker, Marc
Published in arXiv.org (20.05.2023)
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Published in arXiv.org (20.05.2023)
Paper
Interactive configurator with FO(.) and IDP-Z3
Carbonnelle, Pierre, Vandevelde, Simon, Vennekens, Joost, Denecker, Marc
Published in arXiv.org (20.03.2023)
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Published in arXiv.org (20.03.2023)
Paper
IMPOSING AND DETERMINING STRESS IN SUB-MICRON SAMPLES
GRAVIER SEBASTIEN, CARBONNELLE PIERRE, RASKIN JEAN-PIERRE, PARDOEN THOMAS
Year of Publication 04.03.2010
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Year of Publication 04.03.2010
Patent
IMPOSING AND DETERMINING STRESS IN SUB-MICRON SAMPLES
PARDOEN, THOMAS, RASKIN, JEAN-PIERRE, GRAVIER, SEBASTIEN, CARBONNELLE, PIERRE
Year of Publication 18.11.2009
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Year of Publication 18.11.2009
Patent
IMPOSING AND DETERMINING STRESS IN SUB-MICRON SAMPLES
PARDOEN, THOMAS, RASKIN, JEAN-PIERRE, GRAVIER, SEBASTIEN, CARBONNELLE, PIERRE
Year of Publication 30.07.2009
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Year of Publication 30.07.2009
Patent
IMPOSING AND DETERMINING STRESS IN SUB-MICRON SAMPLES
PARDOEN, THOMAS, RASKIN, JEAN-PIERRE, GRAVIER, SEBASTIEN, CARBONNELLE, PIERRE
Year of Publication 11.12.2008
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Year of Publication 11.12.2008
Patent
IMPOSING AND DETERMINING STRESS IN SUB-MICRON SAMPLES
PARDOEN, THOMAS, RASKIN, JEAN-PIERRE, GRAVIER, SEBASTIEN, CARBONNELLE, PIERRE
Year of Publication 21.08.2008
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Year of Publication 21.08.2008
Patent
IMPOSING AND DETERMINING STRESS IN SUB-MICRON SAMPLES
PARDOEN, THOMAS, RASKIN, JEAN-PIERRE, GRAVIER, SEBASTIEN, CARBONNELLE, PIERRE
Year of Publication 21.08.2008
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Year of Publication 21.08.2008
Patent