by Tanner, D.M., Walraven, J.A., Dugger, M.T., Parson, T.B., Candelaria, S.A., Jenkins, M.W., Corwin, A.D., Ohlhausen, J.A., Huffman, E.M.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)