Investigation of the ISPP dynamics and of the programming efficiency of charge-trap memories
Maconi, Alessandro, Compagnoni, Christian Monzio, Amoroso, Salvatore M, Mascellino, Evelyne, Ghidotti, Michele, Padovini, Giorgio, Spinelli, Alessandro S, Lacaita, Andrea L, Mauri, Aurelio, Ghidini, Gabriella, Galbiati, Nadia, Sebastiani, Alessandro, Scozzari, Claudia, Greco, Eugenio, Camozzi, Elisa, Tessariol, Paolo
Published in 2010 Proceedings of the European Solid State Device Research Conference (01.09.2010)
Published in 2010 Proceedings of the European Solid State Device Research Conference (01.09.2010)
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Conference Proceeding
Organic Offset Deposition by Innovative Plasma Technology: Channel Length Modulation for NOR Flash Memories
Zanderigo, Federica, Piumi, Daniele, Ghilardi, Tecla, Camozzi, Elisa, Scintu, Petronilla, Boccardi, Maria Rosaria, Zhu, Helen, Sadjadi, Reza, Romano, Andy
Published in ECS transactions (17.11.2008)
Published in ECS transactions (17.11.2008)
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Journal Article
Photon moment analysis in cells in the presence of photo-bleaching
Caccia, Michele, Camozzi, Elisa, Collini, Maddalena, Zaccolo, Manuela, Chirico, Giuseppe
Published in Applied spectroscopy (01.02.2005)
Published in Applied spectroscopy (01.02.2005)
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Journal Article
Reliability constraints for TANOS memories due to alumina trapping and leakage
Amoroso, S M, Mauri, A, Galbiati, N, Scozzari, C, Mascellino, E, Camozzi, E, Rangoni, A, Ghilardi, T, Grossi, A, Tessariol, P, Compagnoni, C M, Maconi, A, Lacaita, A L, Spinelli, A S, Ghidini, G
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
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Conference Proceeding
3DNAND GIDL-Assisted Body Biasing for Erase Enabling CMOS under Array (CUA) Architecture
Caillat, C., Beaman, K., Bicksler, A., Camozzi, E., Ghilardi, T., Huang, G., Liu, H., Liu, Y., Mao, D., Mujumdar, S., Righetti, N., Ulrich, M., Venkatasubramanian, C., Yang, X., Goda, A., Gowda, S., Mebrahtu, H., Sanda, H., Yuwen, Y., Koval, R.
Published in 2017 IEEE International Memory Workshop (IMW) (01.05.2017)
Published in 2017 IEEE International Memory Workshop (IMW) (01.05.2017)
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Conference Proceeding
A Highly Reliable and Cost Effective 16nm Planar NAND Cell Technology
Kueber, William, Puzzilli, Giuseppina, Righetti, Niccolo, Basco, Ricardo, Lin Li, Beltrami, Silvia, Bertuccio, Massimo, Camozzi, Elisa, Daycock, David, King, Matthew, Larsen, Chris, Karpan, Jeff, Goda, Akira, Roberts, Ceredig
Published in 2015 IEEE International Memory Workshop (IMW) (01.05.2015)
Published in 2015 IEEE International Memory Workshop (IMW) (01.05.2015)
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Conference Proceeding