A Prescan Method to Accelerate Near-Field Scan Immunity Tests
Boyer, Alexandre, Caignet, Fabrice
Published in IEEE journal on electromagnetic compatibility practice and applications (01.06.2024)
Published in IEEE journal on electromagnetic compatibility practice and applications (01.06.2024)
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Journal Article
A Pre-Scan Method to Accelerate Near-Field Scan Immunity Tests
Boyer, Alexandre, Caignet, Fabrice
Published in IEEE journal on electromagnetic compatibility practice and applications (01.02.2024)
Published in IEEE journal on electromagnetic compatibility practice and applications (01.02.2024)
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Journal Article
Investigation of Frequency Models to Predict Dynamic Behavior of ESD Protection Networks
Caignet, Fabrice, Ruffat, Francois, Boyer, Alexandre, Mejecaze, Guillaume, Escudie, Fabien, Puybaret, Frederic
Published in IEEE transactions on electromagnetic compatibility (01.12.2022)
Published in IEEE transactions on electromagnetic compatibility (01.12.2022)
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Journal Article
New measurement method to investigated service life of protection networks exposed to ESD
Ruffat, F., Caignet, F., Boyer, A., Escudié, F., Mejecaze, G., Puybaret, F.
Published in Microelectronics and reliability (01.11.2022)
Published in Microelectronics and reliability (01.11.2022)
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Journal Article
Multisource and Battery-Free Energy Harvesting Architecture for Aeronautics Applications
Vanhecke, Claude, Assouere, Laurent, Anqing Wang, Durand-Estebe, Paul, Caignet, Fabrice, Dilhac, Jean-Marie, Bafleur, Marise
Published in IEEE transactions on power electronics (01.06.2015)
Published in IEEE transactions on power electronics (01.06.2015)
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Journal Article
A fast and efficient Model Extraction Method to predict the transient Response of ESD Protection Devices
Ruffat, Francois, Caignet, Fabrice, Boyer, Alexandre, Escudie, Fabien, Mejecaze, Guillaume, Puybaret, Frederic
Published in 2022 International Symposium on Electromagnetic Compatibility – EMC Europe (05.09.2022)
Published in 2022 International Symposium on Electromagnetic Compatibility – EMC Europe (05.09.2022)
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Conference Proceeding
Prediction of LIN communication robustness against EFT events using dedicated failure models
Escudié, F., Caignet, F., Nolhier, N., Bafleur, M.
Published in Microelectronics and reliability (01.09.2017)
Published in Microelectronics and reliability (01.09.2017)
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Journal Article
Impact of non-linear capacitances on transient waveforms during system level ESD stress
Escudié, F., Caignet, F., Nolhier, N., Bafleur, M.
Published in Microelectronics and reliability (01.09.2016)
Published in Microelectronics and reliability (01.09.2016)
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Journal Article
Reliability of ESD protection devices designed in a 3D technology
Courivaud, B., Nolhier, N., Ferru, G., Bafleur, M., Caignet, F.
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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Journal Article
Conference Proceeding
On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress
Caigneť, F., Nolhier, N., Bafleur, M., Wang, A., Mauran, N.
Published in Microelectronics and reliability (01.09.2013)
Published in Microelectronics and reliability (01.09.2013)
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Journal Article
Conference Proceeding