A 64 × 128 3D-Stacked SPAD Image Sensor for Low-Light Imaging
Wang, Zhe, Yang, Xu, Tian, Na, Liu, Min, Cai, Ziteng, Feng, Peng, Dou, Runjiang, Yu, Shuangming, Wu, Nanjian, Liu, Jian, Liu, Liyuan
Published in Sensors (Basel, Switzerland) (05.07.2024)
Published in Sensors (Basel, Switzerland) (05.07.2024)
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Journal Article
A 3 THz CMOS Image Sensor
Liu, Min, Cai, Ziteng, Wang, Zhe, Zhou, Shaohua, Law, Man-Kay, Liu, Jian, Ma, Jianguo, Wu, Nanjian, Liu, Liyuan
Published in IEEE journal of solid-state circuits (01.09.2024)
Published in IEEE journal of solid-state circuits (01.09.2024)
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Journal Article
Exploration of high-speed 3.0 THz imaging with a 65 nm CMOS process
Liu, Min, Cai, Ziteng, Liu, Jian, Wu, Nanjian, Liu, Liyuan
Published in Journal of semiconductors (01.10.2023)
Published in Journal of semiconductors (01.10.2023)
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Journal Article
A 16.4kPixel 3.08-to-3.86THz Digital Real-Time CMOS Image Sensor with 73dB Dynamic Range
Liu, Min, Cai, Ziteng, Zhou, Shaohua, Law, Man-Kay, Liu, Jian, Ma, Jianguo, Wu, Nanjian, Liu, Liyuan
Published in 2023 IEEE International Solid- State Circuits Conference (ISSCC) (19.02.2023)
Published in 2023 IEEE International Solid- State Circuits Conference (ISSCC) (19.02.2023)
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Conference Proceeding
A Novel Active Inductor with High Q Factor and Inductance and Mutually Independent Tuning Characteristic
Liang, Yan, Zhang, Wanrong, Xie, Hongyun, Jin, Dongyue, Na, Weicong, Xu, Yamei, Cai, ZiTeng
Published in 2021 IEEE 15th International Conference on Anti-counterfeiting, Security, and Identification (ASID) (29.10.2021)
Published in 2021 IEEE 15th International Conference on Anti-counterfeiting, Security, and Identification (ASID) (29.10.2021)
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Conference Proceeding
A Novel Active Inductor with Almost Simultaneously Constant L and Peak Q at Different Frequencies and Independent Q Tunability
Xu, Yamei, Zhang, Wanrong, Xie, Hongyun, Jin, Dongyue, Na, Weicong, Liang, Yan, Cai, Ziteng
Published in 2021 IEEE 15th International Conference on Anti-counterfeiting, Security, and Identification (ASID) (29.10.2021)
Published in 2021 IEEE 15th International Conference on Anti-counterfeiting, Security, and Identification (ASID) (29.10.2021)
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Conference Proceeding