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"CROSS ANDREW JAMES"
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광학 검사 결과들로부터 형성한 계측 가이드 검사 샘플
by
MANI ANTONIO
,
SAH KAUSHIK
,
CROSS ANDREW JAMES
Year of Publication
16.12.2019
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제조된 컴포넌트로부터 식별된 패턴 결함들의 체계적인 및 확률론적인 특성화를 위한 시스템, 방법 및 컴퓨터 프로그램 제품
by
PARK ALLEN
,
PREIL MOSHE E
,
CROSS ANDREW JAMES
Year of Publication
21.11.2019
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Sensitivity improvement of optical and SEM defection inspection
by
Cross
,
Andrew James
,
Halder, Sandip
,
Sah, Kaushik
,
Das, Sayantan
Year of Publication
20.08.2024
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SENSITIVITY IMPROVEMENT OF OPTICAL AND SEM DEFECTION INSPECTION
by
Cross
,
Andrew James
,
Halder, Sandip
,
Sah, Kaushik
,
Das, Sayantan
Year of Publication
04.08.2022
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Aware system, method and computer program product for detecting overlay-related defects in multi-patterned fabricated devices
by
Cross
,
Andrew James
,
Sah, Kaushik
Year of Publication
04.09.2018
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Metrology guided inspection sample shaping of optical inspection results
by
Cross
,
Andrew James
,
Sah, Kaushik
,
Mani, Antonio
Year of Publication
24.03.2020
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DESIGN AWARE SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR DETECTING OVERLAY-RELATED DEFECTS IN MULTI-PATTERNED FABRICATED DEVICES
by
Cross Andrew James
,
Sah Kaushik
Year of Publication
12.10.2017
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System, method and computer program product for systematic and stochastic characterization of pattern defects identified from a semiconductor wafer
by
Cross
,
Andrew James
,
Preil, Moshe
,
Park, Allen
Year of Publication
16.04.2019
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METHODS FOR IMPROVING OPTICAL INSPECTION AND METROLOGY IMAGE QUALITY USING CHIP DESIGN DATA
by
Cross
,
Andrew James
,
Sah, Kaushik
,
Jayaraman, Thirupurasundari
,
Sivaraman, Gangadharan
,
Kandukuri, Srikanth
Year of Publication
25.08.2022
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METROLOGY GUIDED INSPECTION SAMPLE SHAPING FROM OPTICAL INSPECTION RESULTS
by
CROSS
,
Andrew James
,
SAH, Kaushik
,
MANI, Antonio
Year of Publication
08.11.2018
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Metrology Guided Inspection Sample Shaping of Optical Inspection Results
by
Cross
,
Andrew James
,
Sah, Kaushik
,
Mani, Antonio
Year of Publication
08.11.2018
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SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR SYSTEMATIC AND STOCHASTIC CHARACTERIZATION OF PATTERN DEFECTS IDENTIFIED FROM A SEMICONDUCTOR WAFER
by
Cross
,
Andrew James
,
Preil, Moshe
,
Park, Allen
Year of Publication
18.10.2018
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System, method and computer program product for systematic and stochastic characterization of pattern defects identified from a semiconductor wafer
by
CROSS
,
ANDREW JAMES
,
PARK, ALLEN
,
PREIL, MOSHE
Year of Publication
21.12.2021
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Metrology guided inspection sample shaping of optical inspection results
by
SAH, KAUSHIK
,
MANI, ANTONIO
,
CROSS
,
ANDREW JAMES
Year of Publication
21.12.2021
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SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR SYSTEMATIC AND STOCHASTIC CHARACTERIZATION OF PATTERN DEFECTS IDENTIFIED FROM A FABRICATED COMPONENT
by
CROSS
,
Andrew James
,
PARK, Allen
,
PREIL, Moshe E
Year of Publication
18.10.2018
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Sensitivity improvement of optical and sem defection inspection
by
HALDER, SANDIP
,
SAH, KAUSHIK
,
CROSS
,
ANDREW JAMES
,
DAS, SAYANTAN
Year of Publication
01.09.2022
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Design aware system, method and computer program product for detecting overlay-related defects in multi-patterned fabricated devices
by
SAH, KAUSHIK
,
CROSS
,
ANDREW JAMES
Year of Publication
16.01.2018
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Methods for improving optical inspection and metrology image quality using chip design data
by
JAYARAMAN, THIRUPURASUNDARI
,
SIVARAMAN, GANGADHARAN
,
SAH, KAUSHIK
,
KANDUKURI, SRIKANTH
,
CROSS
,
ANDREW JAMES
Year of Publication
01.11.2022
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Metrology guided inspection sample shaping of optical inspection results
by
SAH, KAUSHIK
,
MANI, ANTONIO
,
CROSS
,
ANDREW JAMES
Year of Publication
16.02.2019
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System, method and computer program product for systematic and stochastic characterization of pattern defects identified from a semiconductor wafer
by
CROSS
,
ANDREW JAMES
,
PARK, ALLEN
,
PREIL, MOSHE
Year of Publication
01.12.2018
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