IBM System z9 eFUSE applications and methodology
Rizzolo, R. F., Foote, T. G., Crafts, J. M., Grosch, D. A., Leung, T. O., Lund, D. J., Mechtly, B. L., Robbins, B. J., Slegel, T. J., Tremblay, M. J., Wiedemeier, G. A.
Published in IBM journal of research and development (01.01.2007)
Published in IBM journal of research and development (01.01.2007)
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Journal Article
Adaptive frequency optimization in processors
Crafts, James M, Reick, Kevin F, Chadwick, Nathaniel R, Tetzloff, Jon Robert, Christensen, Bjorn P, Hall, Allen R
Year of Publication 23.08.2022
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Year of Publication 23.08.2022
Patent
Functional Test and Speed/Power Sorting of the IBM POWER6 and Z10 Processors
Pham, T.N., Clougherty, F., Salem, G., Crafts, J.M., Tetzloff, J., Moczygemba, P., Skergan, T.M.
Published in 2008 IEEE International Test Conference (01.10.2008)
Published in 2008 IEEE International Test Conference (01.10.2008)
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Conference Proceeding
ADAPTIVE FREQUENCY OPTIMIZATION IN PROCESSORS
Crafts, James M, Reick, Kevin F, Chadwick, Nathaniel R, Tetzloff, Jon Robert, Christensen, Bjorn P, Hall, Allen R
Year of Publication 05.03.2020
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Year of Publication 05.03.2020
Patent
Adaptive frequency optimization in processors
Crafts, James M, Reick, Kevin F, Chadwick, Nathaniel R, Tetzloff, Jon Robert, Christensen, Bjorn P, Hall, Allen R
Year of Publication 17.12.2019
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Year of Publication 17.12.2019
Patent
ADAPTIVE FREQUENCY OPTIMIZATION IN PROCESSORS
Crafts, James M, Reick, Kevin F, Chadwick, Nathaniel R, Tetzloff, Jon Robert, Christensen, Bjorn P, Hall, Allen R
Year of Publication 11.10.2018
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Year of Publication 11.10.2018
Patent
Low-voltage IC test for defect screening
GREENE KARRE M, LAVALLEE KENNETH A, POINDEXTER DANIEL J, STEVENS KEITH C, CRAFTS JAMES M
Year of Publication 15.03.2016
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Year of Publication 15.03.2016
Patent
Programmable active thermal control
CHASE HAROLD, VAN HORN JODY J, CONTI DENNIS R, GARDELL DAVID L, HOLLE ANDREW T, CRAFTS JAMES M, PATRASCU ADRIAN
Year of Publication 06.10.2015
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Year of Publication 06.10.2015
Patent
LOW-VOLTAGE IC TEST FOR DEFECT SCREENING
GREENE KARRE M, LAVALLEE KENNETH A, POINDEXTER DANIEL J, STEVENS KEITH C, CRAFTS JAMES M
Year of Publication 03.07.2014
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Year of Publication 03.07.2014
Patent
PROGRAMMABLE ACTIVE THERMAL CONTROL
CHASE HAROLD, VAN HORN JODY J, CONTI DENNIS R, GARDELL DAVID L, HOLLE ANDREW T, CRAFTS JAMES M, PATRASCU ADRIAN
Year of Publication 25.10.2012
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Year of Publication 25.10.2012
Patent
Segmented architecture for wafer test & burn-in
CONTI, DENNIS R, BACHELDER, THOMAS W, CRAFTS, JAMES M, BARRINGER, DENNIS R, GARDELL, DAVID L.
Year of Publication 11.09.2000
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Year of Publication 11.09.2000
Patent
TESTER
PAUL M GASUKE, PERRY CHARLES H, THOMAS W BACHELDER, MARK R LAFOSSE, DR ROGER R SKUMID, DENISE R CONCH, JAMES M CRAFTS, JOSEPH J VAN HORNE, DENISE R BARINGER, DAVID L GADEL, WAYDE H WHITE
Year of Publication 26.12.2001
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Year of Publication 26.12.2001
Patent
Segmented architecture for wafer test & burn-in
CONTI DENNIS R, PERRY CHARLES H, SCHMIDT ROGER R, GARDELL DAVID L, GASCHKE PAUL M, VAN HORN JOSEPH J, BACHELDER THOMAS W, BARRINGER DENNIS R, WHITE WADE H, LAFORCE MARK R, CRAFTS JAMES M
Year of Publication 13.12.2001
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Year of Publication 13.12.2001
Patent
Segmented architecture for wafer test and burn-in
CONTI DENNIS R, PERRY CHARLES H, SCHMIDT ROGER R, GARDELL DAVID L, GASCHKE PAUL M, VAN HORN JOSEPH J, BACHELDER THOMAS W, BARRINGER DENNIS R, WHITE WADE H, LAFORCE MARK R, CRAFTS JAMES M
Year of Publication 14.08.2001
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Year of Publication 14.08.2001
Patent