The influence of in situ photoexcitation on a defect structure generation in Ar+ implanted GaAs(001) crystals revealed by high-resolution x-ray diffraction and Rutherford backscattering spectroscopy
Chtcherbatchev, K D, Bublik, V T, Markevich, A S, Mordkovich, V N, Alves, E, Barradas, N P, Sequeira, A D
Published in Journal of physics. D, Applied physics (21.05.2003)
Published in Journal of physics. D, Applied physics (21.05.2003)
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Conference Proceeding
InP decomposition phosphorus beam source for MBE: design, properties and superlattice growth
Putyato, M A, Bolkhovityanov, Yu B, Chikichev, S I, Feklin, D F, Gilinsky, A M, Gutakovskii, A K, Preobrazhenskii, V V, Revenko, M A, Semyagin, B R, Chtcherbatchev, K D
Published in Semiconductor science and technology (01.06.2003)
Published in Semiconductor science and technology (01.06.2003)
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Application of high-resolution X-ray diffraction to study strain status in Si1-xGex/Si1-yGey/Si (001) heterostructures
CHTCHERBATCHEV, K. D, SEQUEIRA, A. D, FRANCO, N, BARRADAS, N. P, MYRONOV, M, MIRONOV, O. A, PARKER, E. H. C
Published in Materials science & engineering. B, Solid-state materials for advanced technology (30.04.2002)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (30.04.2002)
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Conference Proceeding
Ultra low energy SIMS, XTEM and X-ray diffraction methods for the characterization of a MBE grown short period (SinGem)16 superlattices
MIRONOV, O. A, FULGONI, D. J. F, MORANTE, J. R, PARRY, C. P, COOKE, G. A, DOWSETT, M. G, PARKER, E. H. C, CHTCHERBATCHEV, K. D, BASSAS, J. M, ROMANO-RODRIGUEZ, A, PEREZ-RODRIGUEZ, A
Published in Thin solid films (15.05.2000)
Published in Thin solid films (15.05.2000)
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Conference Proceeding
Journal Article
Point Defect Clusters in Pb1−xInxTe Single Crystals Revealed by X-ray Diffuse Scattering Method
Zlomanov, V.P., Chtcherbatchev, K.D., Tkalich, A.K.
Published in Journal of solid state chemistry (01.04.1998)
Published in Journal of solid state chemistry (01.04.1998)
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Structural analysis of buried conducting CoSi2 layers formed in Si by high-dose Co ion implantation
Galayev, A.A, Parkhomenko, Yu.N, Chtcherbatchev, K.D, Podgorny, D.A, Belogorohov, A.I, Diéguez, A, Romano-Rodriguez, A, Pérez-Rodrı́guez, A, Morante, J.R
Published in Journal of crystal growth (01.05.1998)
Published in Journal of crystal growth (01.05.1998)
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Ultra low energy SIMS, XTEM and X-ray diffraction methods for the characterization of a MBE grown short period (Si sub(n)Ge sub(m)) sub(16) superlattices
Mironov, O A, Fulgoni, D J F, Parry, C P, Cooke, G A, Dowsett, M G, Parker, E H C, Chtcherbatchev, K D, Bassas, J M, Romano-Rodriguez, A, Perez-Rodriguez, A, Morante, J R
Published in Thin solid films (01.01.2000)
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Published in Thin solid films (01.01.2000)
Journal Article
InP decomposition phosphorus beam source for MBE: design, properties and superlattice growth
PUTYATO, M. A, BOLKHOVITYANOV, Yu B, CHIKICHEV, S. I, FEKLIN, D. F, GILINSKY, A. M, GUTAKOVSKII, A. K, PREOBRAZHENSKII, V. V, REVENKO, M. A, SEMYAGIN, B. R, CHTCHERBATCHEV, K. D
Published in Semiconductor science and technology (2003)
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Published in Semiconductor science and technology (2003)
Journal Article
Structural analysis of buried conducting CoSi2 layers formed in Si by high-dose Co ion implantation
GALAYEV, A. A, PARKHOMENKO, Yu. N, CHTCHERBATCHEV, K. D, PODGORNY, D. A, BELOGOROHOV, A. I, DIEGUEZ, A, ROMANO-RODRIGUEZ, A, PEREZ-RODRIGUEZ, A, MORANTE, J. R
Published in Journal of crystal growth (1998)
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Published in Journal of crystal growth (1998)
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