Search Results - "CHRISTOPHER F BEVIS" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

(Invited) Synthesis, Characterization, and Application of Tunable Resistance Coatings Prepared by Atomic Layer Deposition

(Invited) Synthesis, Characterization, and Application of Tunable Resistance Coatings Prepared by Atomic Layer Deposition

by Elam, Jeffrey W., Mane, Anil U, Libera, Joseph A., Hryn, John N., Siegmund, Oswald HW, McPhate, Jason, Wetstein, Matthew J, Elagin, Andrey, Minot, Michael J, O'Mahony, Aileen, Wagner, Robert G, Tong, William M, Brodie, Alan D., McCord, Mark A., Bevis, Christopher F.
Published in ECS transactions (01.01.2013)

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Journal Article

METHODS AND SYSTEMS FOR DETERMINING CHARACTERISTIC OF WAFER

METHODS AND SYSTEMS FOR DETERMINING CHARACTERISTIC OF WAFER

by KRIS BHASKAR, DAVID ADLER, MICHAEL D KIRK, CHRISTOPHER F BEVIS
Year of Publication 28.05.2015

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Patent

APPARATUS AND METHOD FOR DETECTING OVERLAY ERROR BY USE OF SCATTEROMETRY

APPARATUS AND METHOD FOR DETECTING OVERLAY ERROR BY USE OF SCATTEROMETRY

by MARK GINOVKER, NOAM KNOLL, JOHN FIELDEN, BORIS GOLOVANEVSKY, PAOLA DECECCO, ANATOLY FABRIKANT, ZARIKI PIOTR, MICHAEL FRIEDMAN, MOSHE BAROUCH, CHRISTOPHER F BEVIS, WHACK DANG, ADELE MICHAEL, BECKETT NOAH, IAN SMITH, MIEHER WALTER D, KENNETH P GROSS, LEWI ADY
Year of Publication 13.06.2019

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Patent

APPARATUS AND METHOD FOR DETECTING OVERLAY ERROR BY USE OF SCATTEROMETRY

APPARATUS AND METHOD FOR DETECTING OVERLAY ERROR BY USE OF SCATTEROMETRY

by MARK GINOVKER, NOAM KNOLL, JOHN FIELDEN, BORIS GOLOVANEVSKY, PAOLA DECECCO, ANATOLY FABRIKANT, ZARIKI PIOTR, MICHAEL FRIEDMAN, MOSHE BAROUCH, CHRISTOPHER F BEVIS, WHACK DANG, ADELE MICHAEL, BECKETT NOAH, IAN SMITH, MIEHER WALTER D, KENNETH P GROSS, LEWI ADY
Year of Publication 28.12.2017

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Patent

APPARATUS AND METHOD FOR DETECTING OVERLAY ERROR BY USE OF SCATTEROMETRY

APPARATUS AND METHOD FOR DETECTING OVERLAY ERROR BY USE OF SCATTEROMETRY

by MARK GINOVKER, NOAM KNOLL, JOHN FIELDEN, BORIS GOLOVANEVSKY, PAOLA DECECCO, ANATOLY FABRIKANT, ZARIKI PIOTR, MICHAEL FRIEDMAN, MOSHE BAROUCH, CHRISTOPHER F BEVIS, WHACK DANG, ADELE MICHAEL, BECKETT NOAH, IAN SMITH, MIEHER WALTER D, KENNETH P GROSS, LEWI ADY
Year of Publication 16.06.2016

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Patent

DEVICE AND METHOD FOR DETECTING OVERLAY ERROR USING SCATTERING MEASUREMENT

DEVICE AND METHOD FOR DETECTING OVERLAY ERROR USING SCATTERING MEASUREMENT

by MARK GINOVKER, NOAM KNOLL, JOHN FIELDEN, BORIS GOLOVANEVSKY, PAOLA DECECCO, ANATOLY FABRIKANT, ZARIKI PIOTR, MICHAEL FRIEDMAN, MOSHE BAROUCH, CHRISTOPHER F BEVIS, WHACK DANG, ADELE MICHAEL, BECKETT NOAH, IAN SMITH, MIEHER WALTER D, KENNETH P GROSS, LEWI ADY
Year of Publication 19.03.2015

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Patent

Hyper-spectral imaging of airborne biological particles

Hyper-spectral imaging of airborne biological particles

by Bevis, Christopher F, Kent, Joel
Year of Publication 18.10.2022

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Patent

Apparatus and methods for aberration correction in electron beam based system

Apparatus and methods for aberration correction in electron beam based system

by Bevis Christopher F
Year of Publication 28.03.2017

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Patent

Mass spectrometer detector and system and method using the same

Mass spectrometer detector and system and method using the same

by Bevis, Christopher F, Reed, David Allen, Kadyshevitch, Alexander, Cheifetz, Eli, Liu, Yungman Alan, Weingarten, Amit
Year of Publication 21.11.2023

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Patent

APPARATUS AND METHODS FOR ABERRATION CORRECTION IN ELECTRON BEAM BASED SYSTEM

APPARATUS AND METHODS FOR ABERRATION CORRECTION IN ELECTRON BEAM BASED SYSTEM

by BEVIS CHRISTOPHER F
Year of Publication 16.06.2016

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Patent

MASS SPECTROMETER DETECTOR AND SYSTEM AND METHOD USING THE SAME

MASS SPECTROMETER DETECTOR AND SYSTEM AND METHOD USING THE SAME

by BEVIS, Christopher F, LIU, Yungman Alan, KADYSHEVITCH, Alexander, CHEIFETZ, Eli, WEINGARTEN, Amit, REED, David Allen
Year of Publication 14.07.2022

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Patent

Apparatus and methods for aberration correction in electron beam based system

Apparatus and methods for aberration correction in electron beam based system

by BEVIS CHRISTOPHER F
Year of Publication 13.01.2015

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Patent

Mass spectrometer detector and system and method using the same

Mass spectrometer detector and system and method using the same

by Bevis, Christopher F, Reed, David Allen, Kadyshevitch, Alexander, Cheifetz, Eli, Liu, Yungman Alan, Weingarten, Amit
Year of Publication 23.11.2021

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Patent

APPARATUS AND METHOD FOR CORRECTING ABERRATION IN ELECTRON BEAM BASED SYSTEM

APPARATUS AND METHOD FOR CORRECTING ABERRATION IN ELECTRON BEAM BASED SYSTEM

by CHRISTOPHER F BEVIS
Year of Publication 20.05.2013

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Patent

MASS SPECTROMETER DETECTOR AND SYSTEM AND METHOD USING THE SAME

MASS SPECTROMETER DETECTOR AND SYSTEM AND METHOD USING THE SAME

by BEVIS, Christopher F, LIU, Yungman Alan, KADYSHEVITCH, Alexander, CHEIFETZ, Eli, WEINGARTEN, Amit, REED, David Allen
Year of Publication 02.12.2020

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Patent

MASS SPECTROMETER DETECTOR AND SYSTEM AND METHOD USING THE SAME

MASS SPECTROMETER DETECTOR AND SYSTEM AND METHOD USING THE SAME

by BEVIS, Christopher F, LIU, Yungman Alan, KADYSHEVITCH, Alexander, CHEIFETZ, Eli, WEINGARTEN, Amit, REED, David Allen
Year of Publication 18.03.2020

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Patent

MASS SPECTROMETER DETECTOR AND SYSTEM AND METHOD USING THE SAME

MASS SPECTROMETER DETECTOR AND SYSTEM AND METHOD USING THE SAME

by BEVIS, Christopher F, LIU, Yungman Alan, KADYSHEVITCH, Alexander, CHEIFETZ, Eli, WEINGARTEN, Amit, REED, David Allen
Year of Publication 27.02.2020

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Patent

DESIGN DRIVEN INSPECTION OR MEASUREMENT

DESIGN DRIVEN INSPECTION OR MEASUREMENT

by BEVIS CHRISTOPHER F
Year of Publication 21.07.2011

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Patent

Scatterometry target employing non-periodic defect features to enhance or optimize target sensitivity to a parameter of interest

Scatterometry target employing non-periodic defect features to enhance or optimize target sensitivity to a parameter of interest

by Bevis, Christopher F
Year of Publication 10.05.2011

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Patent

Scatterometry target employing non-periodic defect features to enhance or optimize target sensitivity to a parameter of interest

Scatterometry target employing non-periodic defect features to enhance or optimize target sensitivity to a parameter of interest

by BEVIS CHRISTOPHER F
Year of Publication 10.05.2011

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Patent

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