The novel TEM sample preparations technique for long dimension trench
Po Fu Chou, Shu Mei Fang
Published in 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2011)
Published in 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2011)
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Conference Proceeding
Layout debugging demonstration by FIB circuit edit
Po Fu Chou, Chun Ming Tsai, Yu Hsiang Shu
Published in 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2010)
Published in 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2010)
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Conference Proceeding
Leakage detection apparatus and method for multi-channel inkjet cartridge
Su, Shyh-Haur, Chang, Hong-Wen, Lee, Yung-Chin, Chen, Chu-Wen, Chou, Po-Fu, Wu, Chien-Tsung, Chen, Chiu-Neng
Year of Publication 27.02.2007
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Year of Publication 27.02.2007
Patent
METHOD AND APPARATUS FOR FABRICATING NANOPARTICLES
KAN PEI, CHEN CHUN JUNG, LEU CHUN FU, CHOU PO-FU, YANG SHIH-LIANG, SU SHIN-SAN
Year of Publication 04.02.2010
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Year of Publication 04.02.2010
Patent