Design of Low-Cost Test Structures for Measuring Within-Die Process Skew Variations
Majumdar, Amitava, Chong, Nui
Published in 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) (21.03.2022)
Published in 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) (21.03.2022)
Get full text
Conference Proceeding
Field profiling & monitoring of payload transistors in FPGAs
Da Cheng, Majumdar, Amitava, Xiaobao Wang, Nui Chong
Published in 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) (01.07.2017)
Published in 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) (01.07.2017)
Get full text
Conference Proceeding
Thermal stability of electrode stacks for application in oxide film devices
Song, Zhi-tang, Chong, Nui, Wong Chan, Lai-wah Helen, Choy, Chung-loong, Lin, Cheng-lu
Published in Thin solid films (10.03.2002)
Published in Thin solid films (10.03.2002)
Get full text
Journal Article
Performance of GaAs microbridge thermocouple infrared detectors
Nui Chong, Srinivas, T.A.S., Ahmed, H.
Published in Journal of microelectromechanical systems (01.06.1997)
Published in Journal of microelectromechanical systems (01.06.1997)
Get full text
Journal Article
DFT-enabled within-die AC uniformity and performance monitor structure for advanced process
Chong, Nui, Chen, I-Ru, Cheng, Da, Majumdar, Amitava, Yeh, Ping-Chin, Chang, Jonathan
Published in 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2018)
Published in 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2018)
Get full text
Conference Proceeding
IC - IN-DIE TRANSISTOR CHARACTERIZATION IN AN IC
NATHANAEL RHESA, CHUNG DANIEL Y, CHANG CHENG WHANG, CHONG NUI, JENNINGS JOHN K, YEH PING CHIN
Year of Publication 16.06.2017
Get full text
Year of Publication 16.06.2017
Patent
Single event upset tolerant memory device
Wuu, John J, Chong, Nui, Chang, Cheang Whang, Rahul, Kumar, Yachareni, Santosh
Year of Publication 23.07.2024
Get full text
Year of Publication 23.07.2024
Patent
SINGLE EVENT UPSET TOLERANT MEMORY DEVICE
WUU, John J, YACHARENI, Santosh, CHANG, Cheang Whang, RAHUL, Kumar, CHONG, Nui
Year of Publication 20.06.2024
Get full text
Year of Publication 20.06.2024
Patent
Runtime measurement of process variations and supply voltage characteristics
Chang, Cheang-Whang, Chong, Nui, Yeh, Ping-Chin, Majumdar, Amitava, Cheng, Da
Year of Publication 21.02.2023
Get full text
Year of Publication 21.02.2023
Patent
Test circuits for testing a die stack
Chang, Cheang-Whang, Kim, Myongseob, Liu, Henley, Chong, Nui, Majumdar, Amitava, Lin, Albert Shih-Huai
Year of Publication 06.07.2021
Get full text
Year of Publication 06.07.2021
Patent
INTEGRATED CIRCUIT DIE WITH IN-CHIP HEAT SINK
CHANG, Jonathan, PAN, Hong-Tsz, REFAI-AHMED, Gamal, RAMALINGAM, Suresh, CHONG, Nui, LIU, Henley
Year of Publication 05.05.2021
Get full text
Year of Publication 05.05.2021
Patent
Integrated circuit die with in-chip heat sink
Ramalingam, Suresh, Chang, Jonathan, Liu, Henley, Chong, Nui, Refai-Ahmed, Gamal, Pan, Hong-Tsz
Year of Publication 21.04.2020
Get full text
Year of Publication 21.04.2020
Patent